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Title: Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method.

Abstract

No abstract prepared.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Advanced Photon Source, Argonne National Lab., IL (US); State Univ. of New York; Univ. Kiel; Exxon Research and Engineering Co. (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
15002841
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 76; Journal Issue: 19; Other Information: PBD: May 2000; Related Information: May 2000
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; POLYMERS; REFLECTIVITY; X RADIATION; FOURIER ANALYSIS; ADVANCED PHOTON SOURCE

Citation Formats

Seeck, O. H., Kaendler, I. K., Tolan, M., Shin, K., Rafailovich, M. H., Sokolov, J., Kolb, R., and XFD. Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method.. United States: N. p., 2000. Web. doi:10.1063/1.126452.
Seeck, O. H., Kaendler, I. K., Tolan, M., Shin, K., Rafailovich, M. H., Sokolov, J., Kolb, R., & XFD. Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method.. United States. doi:10.1063/1.126452.
Seeck, O. H., Kaendler, I. K., Tolan, M., Shin, K., Rafailovich, M. H., Sokolov, J., Kolb, R., and XFD. Mon . "Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method.". United States. doi:10.1063/1.126452.
@article{osti_15002841,
title = {Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method.},
author = {Seeck, O. H. and Kaendler, I. K. and Tolan, M. and Shin, K. and Rafailovich, M. H. and Sokolov, J. and Kolb, R. and XFD},
abstractNote = {No abstract prepared.},
doi = {10.1063/1.126452},
journal = {Applied Physics Letters},
number = 19,
volume = 76,
place = {United States},
year = {2000},
month = {5}
}