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Title: Characterization of a microfocused circularly polarized x-ray probe.

Abstract

No abstract prepared.

Authors:
; ; ; ; ; ; ;
Publication Date:
Research Org.:
Advanced Photon Source, Argonne National Lab., IL (US); Bell Laboratories, Lucent Technologies (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
15002799
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 71; Journal Issue: 6; Other Information: PBD: Jun 2000; Related Information: Jun. 2000
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; MEASURING INSTRUMENTS; X RADIATION; FOCUSING; PERFORMANCE; POLARIZATION; ADVANCED PHOTON SOURCE

Citation Formats

Pollmann, J., Srajer, G., Maser, J., Lang, J. C., Nelson, C. S., Venkataraman, C. T., Isaacs, E. D., and XFD. Characterization of a microfocused circularly polarized x-ray probe.. United States: N. p., 2000. Web. doi:10.1063/1.1150625.
Pollmann, J., Srajer, G., Maser, J., Lang, J. C., Nelson, C. S., Venkataraman, C. T., Isaacs, E. D., & XFD. Characterization of a microfocused circularly polarized x-ray probe.. United States. doi:10.1063/1.1150625.
Pollmann, J., Srajer, G., Maser, J., Lang, J. C., Nelson, C. S., Venkataraman, C. T., Isaacs, E. D., and XFD. Thu . "Characterization of a microfocused circularly polarized x-ray probe.". United States. doi:10.1063/1.1150625.
@article{osti_15002799,
title = {Characterization of a microfocused circularly polarized x-ray probe.},
author = {Pollmann, J. and Srajer, G. and Maser, J. and Lang, J. C. and Nelson, C. S. and Venkataraman, C. T. and Isaacs, E. D. and XFD},
abstractNote = {No abstract prepared.},
doi = {10.1063/1.1150625},
journal = {Review of Scientific Instruments},
number = 6,
volume = 71,
place = {United States},
year = {2000},
month = {6}
}