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Title: Multiple Film Plane Diagnostic for Shocked Lattice Measurements

Conference ·
DOI:https://doi.org/10.1063/1.1538325· OSTI ID:15002014

Laser-based shock experiments have been conducted in thin Si and Cu crystals at pressures above the Hugoniot Elastic Limit (HEL). In these experiments, static film and x-ray streak cameras recorded x-rays diffracted from lattice planes both parallel and perpendicular to the shock direction. This data showed uniaxial compression of Si (100) along the shock direction and 3-D compression of Cu (100). In the case of the Si diffraction, there was a multiple wave structure observed, which may be due to a 1-D phase transition or a time variation in the shock pressure. A new film-based detector has been developed for these in-situ dynamic diffraction experiments. This large-angle detector consists of 3 film cassettes that are positioned to record x-rays diffracted from a shocked crystal anywhere within a full {pi}-steradian. It records x-rays that are diffracted from multiple lattice planes both parallel and at oblique angles with respect to the shock direction. It is a time-integrating measurement, but time-resolved data may be recorded using a short duration laser pulse to create the diffraction source x-rays. This new instrument has been fielded at the OMEGA and Janus lasers to study single crystal materials shock compressed by direct laser irradiation. In these experiments, a multiple wave structure was observed on many different lattice planes in Si. This data provides information on the structure under compression.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
15002014
Report Number(s):
UCRL-JC-147825; TRN: US200408%%34
Resource Relation:
Journal Volume: 74; Journal Issue: 3; Conference: 14th American Physical Society Topical Conference on High Temperature Plasma Diagnostics, Madison, WI (US), 07/08/2002--07/11/2002; Other Information: PBD: 2 Jul 2002
Country of Publication:
United States
Language:
English

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