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Title: Growth-Induced In-Plane Uniaxial Anisotropy in V 2O 3/Ni Films

Abstract

We report on a strain-induced and temperature dependent uniaxial anisotropy in V 2O 3/Ni hybrid thin films, manifested through the interfacial strain and sample microstructure, and its consequences on the angular dependent magnetization reversal. X-ray diffraction and reciprocal space maps identify the in-plane crystalline axes of the V 2O 3; atomic force and scanning electron microscopy reveal oriented rips in the film microstructure. Quasi-static magnetometry and dynamic ferromagnetic resonance measurements identify a uniaxial magnetic easy axis along the rips. Comparison with films grown on sapphire without rips shows a combined contribution from strain and microstructure in the V 2O 3/Ni films. Magnetization reversal characteristics captured by angular-dependent first order reversal curve measurements indicate a strong domain wall pinning along the direction orthogonal to the rips, inducing an angular-dependent change in the reversal mechanism. Lastly, the resultant anisotropy is tunable with temperature and is most pronounced at room temperature, which is beneficial for potential device applications.

Authors:
ORCiD logo [1]; ORCiD logo [2];  [3];  [4];  [4]; ORCiD logo [5];  [6]
  1. Univ. of California, Davis, CA (United States); NIST Center for Neutron Research, Gaithersburg, MD (United States)
  2. Univ. de los Andes, Bogota (Colombia)
  3. Institut Laue-Langevin, Grenoble cedex (France)
  4. Univ. of California, San Diego, CA (United States)
  5. Univ. of California, Davis, CA (United States)
  6. Colorado State Univ., Fort Collins, CO (United States)
Publication Date:
Research Org.:
Univ. of California, San Diego, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1500097
Grant/Contract Number:  
FG02-87ER45332
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 7; Journal Issue: 1; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Gilbert, Dustin A., Ramírez, Juan Gabriel, Saerbeck, T., Trastoy, J., Schuller, Ivan K., Liu, Kai, and de la Venta, J. Growth-Induced In-Plane Uniaxial Anisotropy in V2O3/Ni Films. United States: N. p., 2017. Web. doi:10.1038/s41598-017-12690-z.
Gilbert, Dustin A., Ramírez, Juan Gabriel, Saerbeck, T., Trastoy, J., Schuller, Ivan K., Liu, Kai, & de la Venta, J. Growth-Induced In-Plane Uniaxial Anisotropy in V2O3/Ni Films. United States. doi:10.1038/s41598-017-12690-z.
Gilbert, Dustin A., Ramírez, Juan Gabriel, Saerbeck, T., Trastoy, J., Schuller, Ivan K., Liu, Kai, and de la Venta, J. Wed . "Growth-Induced In-Plane Uniaxial Anisotropy in V2O3/Ni Films". United States. doi:10.1038/s41598-017-12690-z. https://www.osti.gov/servlets/purl/1500097.
@article{osti_1500097,
title = {Growth-Induced In-Plane Uniaxial Anisotropy in V2O3/Ni Films},
author = {Gilbert, Dustin A. and Ramírez, Juan Gabriel and Saerbeck, T. and Trastoy, J. and Schuller, Ivan K. and Liu, Kai and de la Venta, J.},
abstractNote = {We report on a strain-induced and temperature dependent uniaxial anisotropy in V2O3/Ni hybrid thin films, manifested through the interfacial strain and sample microstructure, and its consequences on the angular dependent magnetization reversal. X-ray diffraction and reciprocal space maps identify the in-plane crystalline axes of the V2O3; atomic force and scanning electron microscopy reveal oriented rips in the film microstructure. Quasi-static magnetometry and dynamic ferromagnetic resonance measurements identify a uniaxial magnetic easy axis along the rips. Comparison with films grown on sapphire without rips shows a combined contribution from strain and microstructure in the V2O3/Ni films. Magnetization reversal characteristics captured by angular-dependent first order reversal curve measurements indicate a strong domain wall pinning along the direction orthogonal to the rips, inducing an angular-dependent change in the reversal mechanism. Lastly, the resultant anisotropy is tunable with temperature and is most pronounced at room temperature, which is beneficial for potential device applications.},
doi = {10.1038/s41598-017-12690-z},
journal = {Scientific Reports},
issn = {2045-2322},
number = 1,
volume = 7,
place = {United States},
year = {2017},
month = {10}
}

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Works referenced in this record:

A Strain-Driven Morphotropic Phase Boundary in BiFeO3
journal, November 2009

  • Zeches, R. J.; Rossell, M. D.; Zhang, J. X.
  • Science, Vol. 326, Issue 5955, p. 977-980
  • DOI: 10.1126/science.1177046

Metal-insulator transitions
journal, October 1998

  • Imada, Masatoshi; Fujimori, Atsushi; Tokura, Yoshinori
  • Reviews of Modern Physics, Vol. 70, Issue 4, p. 1039-1263
  • DOI: 10.1103/RevModPhys.70.1039

The exchange-spring magnet: a new material principle for permanent magnets
journal, July 1991

  • Kneller, E. F.; Hawig, R.
  • IEEE Transactions on Magnetics, Vol. 27, Issue 4, p. 3588-3560
  • DOI: 10.1109/20.102931

Multiferroics progress and prospects in thin films
journal, January 2007

  • Ramesh, R.; Spaldin, Nicola A.
  • Nature Materials, Vol. 6, Issue 1, p. 21-29
  • DOI: 10.1038/nmat1805