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Title: Switchable Out‐of‐Plane Polarization in 2D LiAlTe 2

Authors:
 [1];  [1]; ORCiD logo [2]; ORCiD logo [1]
  1. State Key Laboratory of Superhard MaterialsKey Laboratory of Automobile Materials of MOE and School of Materials Science and EngineeringJilin University Changchun 130012 China
  2. Department of Physics and AstronomyUniversity of Missouri Columbia MO 65211‐7010 USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1499816
Grant/Contract Number:  
DE‐ SC0019114
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Advanced Electronic Materials
Additional Journal Information:
Journal Name: Advanced Electronic Materials Journal Volume: 5 Journal Issue: 5; Journal ID: ISSN 2199-160X
Publisher:
Wiley Blackwell (John Wiley & Sons)
Country of Publication:
United States
Language:
English

Citation Formats

Liu, Zhun, Sun, Yuanhui, Singh, David J., and Zhang, Lijun. Switchable Out‐of‐Plane Polarization in 2D LiAlTe 2. United States: N. p., 2019. Web. doi:10.1002/aelm.201900089.
Liu, Zhun, Sun, Yuanhui, Singh, David J., & Zhang, Lijun. Switchable Out‐of‐Plane Polarization in 2D LiAlTe 2. United States. doi:10.1002/aelm.201900089.
Liu, Zhun, Sun, Yuanhui, Singh, David J., and Zhang, Lijun. Thu . "Switchable Out‐of‐Plane Polarization in 2D LiAlTe 2". United States. doi:10.1002/aelm.201900089.
@article{osti_1499816,
title = {Switchable Out‐of‐Plane Polarization in 2D LiAlTe 2},
author = {Liu, Zhun and Sun, Yuanhui and Singh, David J. and Zhang, Lijun},
abstractNote = {},
doi = {10.1002/aelm.201900089},
journal = {Advanced Electronic Materials},
issn = {2199-160X},
number = 5,
volume = 5,
place = {United States},
year = {2019},
month = {3}
}

Journal Article:
Free Publicly Available Full Text
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Works referenced in this record:

Projector augmented-wave method
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Efficient iterative schemes for ab initio total-energy calculations using a plane-wave basis set
journal, October 1996


Absence of Critical Thickness in an Ultrathin Improper Ferroelectric Film
journal, March 2009


Soft self-consistent pseudopotentials in a generalized eigenvalue formalism
journal, April 1990


Critical thickness for ferroelectricity in perovskite ultrathin films
journal, April 2003

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