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Title: Nanoscale imaging of hydrogen and sodium in alteration layers of corroded glass using ToF-SIMS: Is an auxiliary sputtering ion beam necessary?

Abstract

The hydrogen (H)/sodium (Na) interface is of great interest in glass corrosion research. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is one of the few techniques that can provide nanoscale H and Na imaging simultaneously. However, the optimized condition for ToF-SIMS imaging of H in glass is still unclear. In H depth profiling using ToF-SIMS, H background control is a key, in which an analysis ion beam and a sputtering ion beam work together in an interlaced mode to minimize it. Therefore, it is of great interest to determine if an auxiliary sputtering ion beam is also necessary to control H background in ToF-SIMS imaging of H. In this study, a Bi+ primary ion beam with different auxiliary sputtering beams (Cs+, O2+ and Arn+) were compared on a corroded International Simple Glass (ISG). It was surprising that the H/Na interface could be directly imaged using positive ion imaging without any auxiliary sputtering ion beam under a vacuum of 2-3 × 10-8 mbar. The H+ background was about 5% atomic percent on the pristine ISG glass, which was significantly lower than the H concentration in the alteration layer (~15%). Moreover, positive ion imaging could show distributions of other interesting species simultaneously, providingmore » more comprehensive information of the glass corrosion. The H+ background could be reduced with an auxiliary O2+ sputtering ion beam; however, significant loss of signal intensities was observed. In addition, a higher H background in ToF-SIMS imaging than that in the depth profiling was observed.« less

Authors:
ORCiD logo [1]; ORCiD logo [2];  [3]; ORCiD logo [3]; ORCiD logo [4];  [5]; ORCiD logo [2]
  1. School of Nuclear Science and Technology, Lanzhou University, Lanzhou Gansu 730000 China; W. R. Wiley Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA 99354 USA
  2. W. R. Wiley Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA 99354 USA
  3. CEA, DEN, DE2D, SEVT, F-30207 Bagnols-sur-Ceze France
  4. Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland WA 99354 USA
  5. School of Nuclear Science and Technology, Lanzhou University, Lanzhou Gansu 730000 China
Publication Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1496802
Report Number(s):
PNNL-SA-133548
Journal ID: ISSN 0142-2421
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Journal Article
Journal Name:
Surface and Interface Analysis
Additional Journal Information:
Journal Volume: 51; Journal Issue: 2; Journal ID: ISSN 0142-2421
Publisher:
Wiley
Country of Publication:
United States
Language:
English

Citation Formats

Zhang, Jiandong, Zhang, Yanyan, Collin, Marie, Gin, Stephane, Neeway, James J., Wang, Tieshan, and Zhu, Zihua. Nanoscale imaging of hydrogen and sodium in alteration layers of corroded glass using ToF-SIMS: Is an auxiliary sputtering ion beam necessary?. United States: N. p., 2018. Web. doi:10.1002/sia.6571.
Zhang, Jiandong, Zhang, Yanyan, Collin, Marie, Gin, Stephane, Neeway, James J., Wang, Tieshan, & Zhu, Zihua. Nanoscale imaging of hydrogen and sodium in alteration layers of corroded glass using ToF-SIMS: Is an auxiliary sputtering ion beam necessary?. United States. doi:10.1002/sia.6571.
Zhang, Jiandong, Zhang, Yanyan, Collin, Marie, Gin, Stephane, Neeway, James J., Wang, Tieshan, and Zhu, Zihua. Thu . "Nanoscale imaging of hydrogen and sodium in alteration layers of corroded glass using ToF-SIMS: Is an auxiliary sputtering ion beam necessary?". United States. doi:10.1002/sia.6571.
@article{osti_1496802,
title = {Nanoscale imaging of hydrogen and sodium in alteration layers of corroded glass using ToF-SIMS: Is an auxiliary sputtering ion beam necessary?},
author = {Zhang, Jiandong and Zhang, Yanyan and Collin, Marie and Gin, Stephane and Neeway, James J. and Wang, Tieshan and Zhu, Zihua},
abstractNote = {The hydrogen (H)/sodium (Na) interface is of great interest in glass corrosion research. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is one of the few techniques that can provide nanoscale H and Na imaging simultaneously. However, the optimized condition for ToF-SIMS imaging of H in glass is still unclear. In H depth profiling using ToF-SIMS, H background control is a key, in which an analysis ion beam and a sputtering ion beam work together in an interlaced mode to minimize it. Therefore, it is of great interest to determine if an auxiliary sputtering ion beam is also necessary to control H background in ToF-SIMS imaging of H. In this study, a Bi+ primary ion beam with different auxiliary sputtering beams (Cs+, O2+ and Arn+) were compared on a corroded International Simple Glass (ISG). It was surprising that the H/Na interface could be directly imaged using positive ion imaging without any auxiliary sputtering ion beam under a vacuum of 2-3 × 10-8 mbar. The H+ background was about 5% atomic percent on the pristine ISG glass, which was significantly lower than the H concentration in the alteration layer (~15%). Moreover, positive ion imaging could show distributions of other interesting species simultaneously, providing more comprehensive information of the glass corrosion. The H+ background could be reduced with an auxiliary O2+ sputtering ion beam; however, significant loss of signal intensities was observed. In addition, a higher H background in ToF-SIMS imaging than that in the depth profiling was observed.},
doi = {10.1002/sia.6571},
journal = {Surface and Interface Analysis},
issn = {0142-2421},
number = 2,
volume = 51,
place = {United States},
year = {2018},
month = {10}
}

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