High-quality, single-crystalline silicon-germanium films
Patent
·
OSTI ID:1495665
High-quality, single-crystalline silicon-germanium (Si.sub.(1-x)Ge.sub.x) having a high germanium content is provided. Layers of the high-quality, single-crystalline silicon-germanium can be grown to high sub-critical thicknesses and then released from their growth substrates to provide Si.sub.(1-x)Ge.sub.x films without lattice mismatch-induced misfit dislocations or a mosaic distribution of crystallographic orientations.
- Research Organization:
- Wisconsin Alumni Research Foundation, Madison, WI (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- FG02-03ER46028
- Assignee:
- Wisconsin Alumni Research Foundation (Madison, WI)
- Patent Number(s):
- 10,176,991
- Application Number:
- 15/643,111
- OSTI ID:
- 1495665
- Country of Publication:
- United States
- Language:
- English
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