A new framework for X-ray photon correlation spectroscopy analysis from polycrystalline materials

Lewis, III, Ronald M.; Jackson, Grayson L.; Maher, Michael J.; Kim, Kyungtae; Lodge, Timothy P.; Mahanthappa, Mahesh K.; Narayanan, Suresh; Bates, Frank S.

doi:10.1063/1.5051451

Title: A new framework for X-ray photon correlation spectroscopy analysis from polycrystalline materials

Journal Article · Wed Dec 26 00:00:00 EST 2018 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.5051451· OSTI ID:1492926

^[1]; Jackson, Grayson L. ^[2];

^[1];

^[1]; Lodge, Timothy P. ^[1]; Mahanthappa, Mahesh K. ^[1]; Narayanan, Suresh ^[3];

^[1]

Univ. of Minnesota, Minneapolis, MN (United States)
Univ. of Wisconsin-Madison, Madison, WI (United States)
Argonne National Lab. (ANL), Argonne, IL (United States)

Here, we report a new analytical framework for interpreting data from X-ray photon correlation spectroscopy (XPCS) measurements on polycrystalline materials characterized by strong scattering intensity variations at fixed wavevector magnitude (i.e., anisotropic scattering). Currently, no analytical method exists for the interpretation of the time-dependent anisotropic scattering from such materials. The framework is applied to interrogate the dynamics of a spherical micelle-forming diblock copolymer melt below the order-disorder transition, wherein finite size grains of micellar body-centered cubic structure produce anisotropic scattering. A wealth of analytical information is recovered from a simple measurement, including distributions of relaxation times and speeds associated with micelles within grains. The findings of this study demonstrate the efficacy of this new analytical method, which may be readily adapted for application to a variety of materials and systems.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1492926

Journal Information:: Review of Scientific Instruments, Vol. 89, Issue 12; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 2 works

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