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Title: Extending the depth of field for ptychography using complex-valued wavelets

Abstract

Ptychography is a scanning variation of the coherent diffractive imaging method for providing high-resolution quantitative images from specimen with extended dimensions. Its capability of achieving diffraction-limited spatial resolution can be compromised by the sample thickness, which is generally required to be thinner than the depth of field of the imaging system. In this Letter, we present a method to extend the depth of field for ptychography by numerically generating the focus stack from reconstructions with propagated illumination wavefronts and combining the in-focus features to a single sharp image using an algorithm based on the complex-valued discrete wavelet transform. Furthermore, this approach does not require repeated measurements by translating the sample along the optical axis as in the conventional focus stacking method, and offers a computation-efficient alternative to obtain high-resolution images with extended depth of fields, complementary to the multi-slice ptychography.

Authors:
 [1];  [1];  [2];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States); Univ. College London, London (United Kingdom)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1490907
Alternate Identifier(s):
OSTI ID: 1491133
Report Number(s):
BNL-210884-2019-JAAM
Journal ID: ISSN 0146-9592; OPLEDP
Grant/Contract Number:  
SC0012704
Resource Type:
Journal Article: Published Article
Journal Name:
Optics Letters
Additional Journal Information:
Journal Volume: 44; Journal Issue: 3; Journal ID: ISSN 0146-9592
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Huang, Xiaojing, Yan, Hanfei, Robinson, Ian K., and Chu, Yong S. Extending the depth of field for ptychography using complex-valued wavelets. United States: N. p., 2019. Web. doi:10.1364/OL.44.000503.
Huang, Xiaojing, Yan, Hanfei, Robinson, Ian K., & Chu, Yong S. Extending the depth of field for ptychography using complex-valued wavelets. United States. doi:10.1364/OL.44.000503.
Huang, Xiaojing, Yan, Hanfei, Robinson, Ian K., and Chu, Yong S. Wed . "Extending the depth of field for ptychography using complex-valued wavelets". United States. doi:10.1364/OL.44.000503.
@article{osti_1490907,
title = {Extending the depth of field for ptychography using complex-valued wavelets},
author = {Huang, Xiaojing and Yan, Hanfei and Robinson, Ian K. and Chu, Yong S.},
abstractNote = {Ptychography is a scanning variation of the coherent diffractive imaging method for providing high-resolution quantitative images from specimen with extended dimensions. Its capability of achieving diffraction-limited spatial resolution can be compromised by the sample thickness, which is generally required to be thinner than the depth of field of the imaging system. In this Letter, we present a method to extend the depth of field for ptychography by numerically generating the focus stack from reconstructions with propagated illumination wavefronts and combining the in-focus features to a single sharp image using an algorithm based on the complex-valued discrete wavelet transform. Furthermore, this approach does not require repeated measurements by translating the sample along the optical axis as in the conventional focus stacking method, and offers a computation-efficient alternative to obtain high-resolution images with extended depth of fields, complementary to the multi-slice ptychography.},
doi = {10.1364/OL.44.000503},
journal = {Optics Letters},
issn = {0146-9592},
number = 3,
volume = 44,
place = {United States},
year = {2019},
month = {1}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1364/OL.44.000503

Citation Metrics:
Cited by: 1 work
Citation information provided by
Web of Science

Figures / Tables:

Fig. 1 Fig. 1: Schematic experimental setup for a ptychography experiment. The depth of field in the reconstructed image is defined by the signal with the maximum scattering angle collected by the detector, which is typically narrower than the depth of focus defined by the focusing optics. The right panel shows amore » representative far-field diffraction amplitude using a x-ray beam focused by MLLs. The green and red boxes illustrate the numerical apertures determined by detection and focusing optics, respectively.« less

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Works referenced in this record:

The scattering of electrons by atoms and crystals. I. A new theoretical approach
journal, October 1957


    Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.