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Title: Spread Spectrum Time Domain Reflectometry for Complex Impedances: Application to PV Arrays

Abstract

Spread spectrum time domain reflectometry (SSTDR) has previously been used for detection and location of intermittent faults on live electrical wiring. These intermittent faults can be open circuits, short circuits, or resistive changes, all of which preserve the original shape of the SSTDR correlated waveform. But things are very different when SSTDR encounters a complex impedance discontinuity such as a capacitor or inductor. In this case, the reflection is a function of frequency, changing the shape of the SSTDR signature. In this paper, we will show the SSTDR response to single capacitors and inductors. We will also explore how SSTDR responds to arrays of PV panels (which are capacitive) connected by wires. We will show both simulations and measurements. In some configurations, it is relatively easy to see faults, although algorithms are still under development. In other configurations, little change occurs, which makes it very difficult to create a system for testing for these faults.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [2]; ORCiD logo [3]
  1. University of Utah
  2. LiveWire Innovation
  3. National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1489181
Report Number(s):
NREL/CP-5K00-73007
DOE Contract Number:  
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Conference: Presented at 2018 IEEE AUTOTESTCON, 17-20 September 2018, National Harbor, Maryland
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 47 OTHER INSTRUMENTATION; spread spectrum time domain reflectometry; SSTDR; photovoltaic arrays; complex impedances; capacitance; inductance

Citation Formats

Furse, Cynthia, Jayakumar, Naveen Kumar Tumkur, Benoit, Evan, Saleh, Mashad Uddin, LaCombe, Josiah, Scarpulla, Michael, Harley, Joel, Kingston, Samuel, Waddoups, Brent, and Deline, Christopher A. Spread Spectrum Time Domain Reflectometry for Complex Impedances: Application to PV Arrays. United States: N. p., 2018. Web. doi:10.1109/AUTEST.2018.8532521.
Furse, Cynthia, Jayakumar, Naveen Kumar Tumkur, Benoit, Evan, Saleh, Mashad Uddin, LaCombe, Josiah, Scarpulla, Michael, Harley, Joel, Kingston, Samuel, Waddoups, Brent, & Deline, Christopher A. Spread Spectrum Time Domain Reflectometry for Complex Impedances: Application to PV Arrays. United States. doi:10.1109/AUTEST.2018.8532521.
Furse, Cynthia, Jayakumar, Naveen Kumar Tumkur, Benoit, Evan, Saleh, Mashad Uddin, LaCombe, Josiah, Scarpulla, Michael, Harley, Joel, Kingston, Samuel, Waddoups, Brent, and Deline, Christopher A. Thu . "Spread Spectrum Time Domain Reflectometry for Complex Impedances: Application to PV Arrays". United States. doi:10.1109/AUTEST.2018.8532521.
@article{osti_1489181,
title = {Spread Spectrum Time Domain Reflectometry for Complex Impedances: Application to PV Arrays},
author = {Furse, Cynthia and Jayakumar, Naveen Kumar Tumkur and Benoit, Evan and Saleh, Mashad Uddin and LaCombe, Josiah and Scarpulla, Michael and Harley, Joel and Kingston, Samuel and Waddoups, Brent and Deline, Christopher A},
abstractNote = {Spread spectrum time domain reflectometry (SSTDR) has previously been used for detection and location of intermittent faults on live electrical wiring. These intermittent faults can be open circuits, short circuits, or resistive changes, all of which preserve the original shape of the SSTDR correlated waveform. But things are very different when SSTDR encounters a complex impedance discontinuity such as a capacitor or inductor. In this case, the reflection is a function of frequency, changing the shape of the SSTDR signature. In this paper, we will show the SSTDR response to single capacitors and inductors. We will also explore how SSTDR responds to arrays of PV panels (which are capacitive) connected by wires. We will show both simulations and measurements. In some configurations, it is relatively easy to see faults, although algorithms are still under development. In other configurations, little change occurs, which makes it very difficult to create a system for testing for these faults.},
doi = {10.1109/AUTEST.2018.8532521},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {11}
}

Conference:
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