Far-infrared detection using Weyl semimetals

Chan, Ching-Kit; Lee, Patrick A.; Lindner, Netanel; Refael, Gil; Ma, Qiong; Xu, Suyang; Gedik, Nuh

Title: Far-infrared detection using Weyl semimetals

Patent · Tue Oct 02 00:00:00 EDT 2018

OSTI ID:1489040

Chan, Ching-Kit; Lee, Patrick A.; Lindner, Netanel; Refael, Gil; Ma, Qiong; Xu, Suyang; Gedik, Nuh

The generation of photocurrent in an ideal two-dimensional Dirac spectrum is symmetry forbidden. In sharp contrast, a three-dimensional Weyl semimetal can generically support significant photocurrent due to the combination of inversion symmetry breaking and finite tilts of the Weyl spectrum. To realize this photocurrent, a noncentrosymmetric Weyl semimetal is coupled to a pair of electrodes and illuminated with circularly polarized light without any voltage applied to the Weyl semimetal. The wavelength of the incident light can range over tens of microns and can be adjusted by doping the Weyl semimetal to change its chemical potential.

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Research Organization:: Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: FG02-03ER46076; FG02-08ER46521

Assignee:: Massachusetts Institute of Technology (Cambridge, MA)

Patent Number(s):: 10,090,466

Application Number:: 15/656,373

OSTI ID:: 1489040

Resource Relation:: Patent File Date: 2017 Jul 21

Country of Publication:: United States

Language:: English

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