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Title: Neutron damage and recovery studies of SiPMs

Abstract

SiPM lost its performance characteristics when exposed to hig dose of neutrons. However, the distinct hallmark of SiPMs, low dark count and excellent photon-number-resolving capability, can be recovered by thermal annealing. Several SiPMs from different vendors are characterized before and after exposure of up to 1010 neutron/cm2 dosage using a 14 MeV neutron generation source. Collectively, we established that the typical orders of magnitude increase in dark current upon neutron irradiation can be lowered substantially after processing them with a thermal annealing procedure, and single-photon detection are to some extent recovered. Moreover, we found no significant difference on neutron damaged behavior when SiPMs are irradiated at room or liquid nitrogen temperatures suggesting that there is no evidence of radiation hardening when SiPMs are operated in cryogenic temperatures.

Authors:
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1488845
Report Number(s):
BNL-210809-2018-COPA
DOE Contract Number:  
SC0012704
Resource Type:
Conference
Resource Relation:
Conference: Nuclear Science Symposium and Medical Imaging Conference, Sydney Australia, 11/10/2018 - 11/17/2018
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Tsang, Thomas. Neutron damage and recovery studies of SiPMs. United States: N. p., 2018. Web.
Tsang, Thomas. Neutron damage and recovery studies of SiPMs. United States.
Tsang, Thomas. Sat . "Neutron damage and recovery studies of SiPMs". United States. https://www.osti.gov/servlets/purl/1488845.
@article{osti_1488845,
title = {Neutron damage and recovery studies of SiPMs},
author = {Tsang, Thomas},
abstractNote = {SiPM lost its performance characteristics when exposed to hig dose of neutrons. However, the distinct hallmark of SiPMs, low dark count and excellent photon-number-resolving capability, can be recovered by thermal annealing. Several SiPMs from different vendors are characterized before and after exposure of up to 1010 neutron/cm2 dosage using a 14 MeV neutron generation source. Collectively, we established that the typical orders of magnitude increase in dark current upon neutron irradiation can be lowered substantially after processing them with a thermal annealing procedure, and single-photon detection are to some extent recovered. Moreover, we found no significant difference on neutron damaged behavior when SiPMs are irradiated at room or liquid nitrogen temperatures suggesting that there is no evidence of radiation hardening when SiPMs are operated in cryogenic temperatures.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {11}
}

Conference:
Other availability
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