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Title: On evaluating x-ray imaging crystals with synchrotron radiation

Abstract

Bent crystals are central to 1-D resolved x-ray spectroscopy and two-dimensional x-ray imaging of plasmas. Nominally identical crystals may differ in their performance with x-rays even though their visible-light images are close to identical. The detailed information needed to understand those differences, viz., the crystal’s local diffraction properties over the area that contributes to the image, is averaged out in the imaging tests that ideally precede the actual crystal’s use. Here the local diffraction of spherically bent crystals made from quartz is examined in the x-ray topography setup at the x-ray optics testing beamline 1-BM at the Advanced Photon Source, with radiation obtained from a flat quartz conditioning crystal made for the purpose.

Authors:
; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1487024
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Conference: 22nd Topical Conference on High Temperature Plasma Diagnostics, 04/16/18 - 04/19/18, San Diego, CA, US
Country of Publication:
United States
Language:
English

Citation Formats

Pereira, N. R., Macrander, A. T., Stoeckl, C., and Baronova, E. O. On evaluating x-ray imaging crystals with synchrotron radiation. United States: N. p., 2018. Web. doi:10.1063/1.5045569.
Pereira, N. R., Macrander, A. T., Stoeckl, C., & Baronova, E. O. On evaluating x-ray imaging crystals with synchrotron radiation. United States. doi:10.1063/1.5045569.
Pereira, N. R., Macrander, A. T., Stoeckl, C., and Baronova, E. O. Mon . "On evaluating x-ray imaging crystals with synchrotron radiation". United States. doi:10.1063/1.5045569.
@article{osti_1487024,
title = {On evaluating x-ray imaging crystals with synchrotron radiation},
author = {Pereira, N. R. and Macrander, A. T. and Stoeckl, C. and Baronova, E. O.},
abstractNote = {Bent crystals are central to 1-D resolved x-ray spectroscopy and two-dimensional x-ray imaging of plasmas. Nominally identical crystals may differ in their performance with x-rays even though their visible-light images are close to identical. The detailed information needed to understand those differences, viz., the crystal’s local diffraction properties over the area that contributes to the image, is averaged out in the imaging tests that ideally precede the actual crystal’s use. Here the local diffraction of spherically bent crystals made from quartz is examined in the x-ray topography setup at the x-ray optics testing beamline 1-BM at the Advanced Photon Source, with radiation obtained from a flat quartz conditioning crystal made for the purpose.},
doi = {10.1063/1.5045569},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {10}
}

Conference:
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Works referenced in this record:

Soft x-ray backlighting of cryogenic implosions using a narrowband crystal imaging system (invited)
journal, November 2014

  • Stoeckl, C.; Bedzyk, M.; Brent, G.
  • Review of Scientific Instruments, Vol. 85, Issue 11
  • DOI: 10.1063/1.4890215

Experimental characterization of bent focusing crystals
journal, May 2001

  • Lider, V. V.; Baronova, E. O.; Stepanenko, M. M.
  • Crystallography Reports, Vol. 46, Issue 3
  • DOI: 10.1134/1.1376456

Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications
journal, February 2018

  • Huang, Xian-Rong; Gog, Thomas; Kim, Jungho
  • Journal of Applied Crystallography, Vol. 51, Issue 1
  • DOI: 10.1107/s1600576717018155

XOP v2.4: recent developments of the x-ray optics software toolkit
conference, September 2011

  • Sánchez del Río, Manuel; Dejus, Roger J.
  • SPIE Optical Engineering + Applications, SPIE Proceedings
  • DOI: 10.1117/12.893911

X-ray optics testing beamline 1-BM at the advanced photon source
conference, January 2016

  • Macrander, Albert; Erdmann, Mark; Kujala, Naresh
  • PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2015, AIP Conference Proceedings
  • DOI: 10.1063/1.4952853

Relative x-ray collection efficiency, spatial resolution, and spectral resolution of spherically-bent quartz, mica, germanium, and pyrolytic graphite crystals
journal, September 2014

  • Ao, T.; Harding, E. C.; Bailey, J. E.
  • Journal of Quantitative Spectroscopy and Radiative Transfer, Vol. 144
  • DOI: 10.1016/j.jqsrt.2014.03.023

Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source
conference, January 2016

  • Stoupin, Stanislav; Shvyd’ko, Yuri; Trakhtenberg, Emil
  • PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2015, AIP Conference Proceedings
  • DOI: 10.1063/1.4952940

Analysis and implementation of a space resolving spherical crystal spectrometer for x-ray Thomson scattering experiments
journal, April 2015

  • Harding, E. C.; Ao, T.; Bailey, J. E.
  • Review of Scientific Instruments, Vol. 86, Issue 4
  • DOI: 10.1063/1.4918619

Spherical quartz crystals investigated with synchrotron radiation
journal, October 2015

  • Pereira, N. R.; Macrander, A. T.; Hill, K. W.
  • Review of Scientific Instruments, Vol. 86, Issue 10
  • DOI: 10.1063/1.4934197

Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging
journal, October 2018

  • Stoeckl, C.; Filkins, T.; Jungquist, R.
  • Review of Scientific Instruments, Vol. 89, Issue 10
  • DOI: 10.1063/1.5036525

Development of a spatially resolving x-ray crystal spectrometer for measurement of ion-temperature (Ti) and rotation-velocity (v) profiles in ITER
journal, October 2010

  • Hill, K. W.; Bitter, M.; Delgado-Aparicio, L.
  • Review of Scientific Instruments, Vol. 81, Issue 10
  • DOI: 10.1063/1.3492414