A Review of Degradation Behavior and Modeling of Capacitors

Conference · Sat Dec 01 00:00:00 EST 2018

DOI:https://doi.org/10.1115/IPACK2018-8262· OSTI ID:1485547

Gupta, Anunay ^[1]; Yadav, Om Prakash ^[1]; DeVoto, Douglas J ^[2]; Major, Joshua ^[2]

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1. North Dakota State University
2. National Renewable Energy Laboratory (NREL), Golden, CO (United States)

This paper firstly reviews the failure causes, modes and mechanisms of two major types of capacitors used in power electronic systems - metallized film capacitors and electrolytic capacitors. The degradation modeling related to these capacitors is then presented. Both physics-of-failure and data-driven degradation models for reliability and lifetime estimation are discussed. Based on the exhaustive literature review on degradation modeling of capacitors, we provide a critical assessment and future research directions.

• Research Organization: National Renewable Energy Lab. (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE National Renewable Energy Laboratory (NREL), Laboratory Directed Research and Development (LDRD) Program
• DOE Contract Number: AC36-08GO28308
• OSTI ID: 1485547
• Report Number(s): NREL/CP-5400-72930
• Resource Relation: Conference: Presented at the ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (InterPACK 2018), 27-30 August 2018, San Francisco, California
• Country of Publication: United States
• Language: English

Related Subjects

33 ADVANCED PROPULSION SYSTEMS
power electronic system
metallized film capacitors
electrolytic capacitors