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Scanning method for screening of electronic devices

Patent ·
OSTI ID:1485290
; ; ;
A visualization method for screening electronic devices is provided. In accordance with the disclosed method, a probe is applied to a grid of multiple points on the circuit, and an output produced by the circuit in response to the stimulus waveform is monitored for each of multiple grid points where the probe is applied. A power spectrum analysis (PSA) produces a power spectrum amplitude, in each of one or more frequency bins, on the monitored output for each of the multiple grid points. The PSA provides a respective pixel value for each of the multiple grid points. An image is displayed, in which image portions representing the multiple grid points are displayed with the respective pixel values.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
Patent Number(s):
10,094,874
Application Number:
15/208,931
OSTI ID:
1485290
Country of Publication:
United States
Language:
English

References (8)

Novel failure analysis techniques using photon probing with a scanning optical microscope conference January 1994
MosaiCode: Visualizing large scale software: A tool demonstration conference September 2011
Laser Voltage Imaging: A New Perspective of Laser Voltage Probing conference November 2010
Identification of radiation-induced parasitic leakage paths using light emission microscopy journal October 2004
TIVA and SEI developments for enhanced front and backside interconnection failure analysis journal June 1999
Algorithm explorer: visualizing algorithms in a 3D multimedia environment journal March 2007
Exploiting UML dynamic object modeling for the visualization of C++ programs conference January 2005
Visualization of exception handling constructs to support program understanding conference January 2008

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