Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS
Characterization of samarium thin films molecular plated from N,N-dimethylformamide solutions onto stainless steel substrates, with either mirrorlike or brushed finishes, was carried out using a Thermo Scientific K-Alpha x-ray photoelectron spectrometer. Survey scans of the two specimens showed the presence of samarium, carbon, and oxygen with minor amounts of sodium. High-resolution spectra were then taken of the Sm 3d, O 1s, and C 1s regions. Furthermore, the chemical compositions of the two samples were found to be very similar, with the key difference being the relative amounts of two carbon species. Spectra from the survey and narrow high-resolution scans of the Sm 3d, O 1s, and C 1s regions are reported herein.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Nuclear Physics (NP)
- Grant/Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1485007
- Alternate ID(s):
- OSTI ID: 1823515
- Journal Information:
- Surface Science Spectra, Vol. 25, Issue 2; ISSN 1055-5269
- Publisher:
- American Vacuum Society - AIPCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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