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Title: Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions

Journal Article · · Synchrotron Radiation News

The development of ultra-brilliant synchrotron facilities and recent advances in the fabrication of efficient nano-focusing optics have stimulated rapid development and applications of the focused beams used to elucidate nanoscale phenomena in many areas of science and technology. Various nano-focusing optics, including Kirkpatrick- Baez (KB) and elliptical mirrors, Fresnel zone plates (ZP), compound refractive and kinoform lenses, and multilayer Laue lenses (MLL), are routinely used to achieve nano-focusing. The latest experiments utilizing KB mirrors have demonstrated focal spot size of 13 nm with the ZPs and MLLs being able to focus hard X-rays to 10 nm and below. When the focused beam size is reduced to below 100 nm, there is a need to develop a dedicated system tailored for a specific application, which satisfies stringent mechanical, vibrational, and thermal characteristics to successfully enable nano-scale imaging. Multiple degrees of motion, including their positioning accuracy, resonance frequencies, and amount of heat being dissipated, have to be thoroughly considered in order to efficiently perform nano-focusing experiments.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
SC0012704
OSTI ID:
1483564
Report Number(s):
BNL-209504-2018-JAAM
Journal Information:
Synchrotron Radiation News, Vol. 31, Issue 5; ISSN 0894-0886
Publisher:
Taylor & FrancisCopyright Statement
Country of Publication:
United States
Language:
English

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  • Fuchs, Martin R.; Bhogadi, Dileep K.; Jakoncic, Jean
  • PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2015, AIP Conference Proceedings https://doi.org/10.1063/1.4952829
conference January 2016
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Figures / Tables (5)


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