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Title: Scientific/Technical Report – Phase IIA Final

Abstract

This project developed advanced focusing devices for high-photon-energy X-rays, up to 25 keV, and up to 20 nm resolution, which can be used to analyze complex composite materials, biological structures, and nano-electronic circuits. The advancement is made possible through the use of ultrananocrystalline diamond as a structural material and Platinum or Iridium deposited by atomic layer deposition as an X-ray absorber in a highly innovative device design for Fresnel zone plates and suited nanofabrication approach based on electron beam lithography.

Authors:
;
Publication Date:
Research Org.:
Advanced Diamond Technologies, Inc.
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1480075
Report Number(s):
Final Scientific/Technical Report
DOE Contract Number:  
SC0011265
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Zone plates, X-rays, synchrotron radiation, diamond, nanofabrication, diffractive optics.

Citation Formats

Moldovan, Nicolaie, and Zeng, Hongjun. Scientific/Technical Report – Phase IIA Final. United States: N. p., 2018. Web. doi:10.2172/1480075.
Moldovan, Nicolaie, & Zeng, Hongjun. Scientific/Technical Report – Phase IIA Final. United States. doi:10.2172/1480075.
Moldovan, Nicolaie, and Zeng, Hongjun. Tue . "Scientific/Technical Report – Phase IIA Final". United States. doi:10.2172/1480075. https://www.osti.gov/servlets/purl/1480075.
@article{osti_1480075,
title = {Scientific/Technical Report – Phase IIA Final},
author = {Moldovan, Nicolaie and Zeng, Hongjun},
abstractNote = {This project developed advanced focusing devices for high-photon-energy X-rays, up to 25 keV, and up to 20 nm resolution, which can be used to analyze complex composite materials, biological structures, and nano-electronic circuits. The advancement is made possible through the use of ultrananocrystalline diamond as a structural material and Platinum or Iridium deposited by atomic layer deposition as an X-ray absorber in a highly innovative device design for Fresnel zone plates and suited nanofabrication approach based on electron beam lithography.},
doi = {10.2172/1480075},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {10}
}