Effects of physical and chemical surface roughness on the brightness of electron beams from photocathodes
The performance of free electron laser x-ray light sources, and systems for ultrafast electron diffraction and ultrafast electron microscopy, is limited by the brightness of the electron sources used. The intrinsic emittance, or equivalently, the mean transverse energy (MTE) of electrons emitted from the photocathode determines the maximum possible brightness in such systems. With ongoing improvements in photocathode design and synthesis, we are now at a point where the physical and chemical surface roughness of the cathode can become a limiting factor. Here we show how measurements of the spatially dependent variations in height and surface potential can be used to compute the electron beam mean transverse energy (MTE), one of the key determining factors in evaluation of brightness.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- KC0407-ALSJNT-I0013; AC02-05CH11231
- OSTI ID:
- 1470798
- Alternate ID(s):
- OSTI ID: 1478355
- Journal Information:
- Physical Review Accelerators and Beams, Journal Name: Physical Review Accelerators and Beams Vol. 21 Journal Issue: 9; ISSN 2469-9888
- Publisher:
- American Physical SocietyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Thermal-field and photoemission from meso- and micro-scale features: Effects of screening and roughness on characterization and simulation
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journal | June 2019 |
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