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Title: Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited)

Authors:
 [1];  [1];  [1];  [1]; ORCiD logo [2];  [3]; ORCiD logo [3];  [4];  [4];  [4];  [4]; ORCiD logo [4];  [5];  [5];  [5];  [5];  [6];  [6];  [6]
  1. General Atomics, San Diego, California 92121, USA
  2. TMC2 Innovations LLC, Murrieta, California 92563, USA
  3. Kentech Instruments Ltd., Wallingford, Oxfordshire OX10 8BD, United Kingdom
  4. Lawrence Livermore National Laboratory, Livermore, California 94550, USA
  5. Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
  6. Laboratory for Laser Energetics, Rochester, New York 14623, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1477908
Grant/Contract Number:  
AC52-07NA27344; NA0001808; NA0001944
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 89 Journal Issue: 10; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Engelhorn, K., Hilsabeck, T. J., Kilkenny, J., Morris, D., Chung, T. M., Dymoke-Bradshaw, A., Hares, J. D., Bell, P., Bradley, D., Carpenter, A. C., Dayton, M., Nagel, S. R., Claus, L., Porter, J., Rochau, G., Sanchez, M., Ivancic, S., Sorce, C., and Theobald, W. Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited). United States: N. p., 2018. Web. doi:10.1063/1.5039648.
Engelhorn, K., Hilsabeck, T. J., Kilkenny, J., Morris, D., Chung, T. M., Dymoke-Bradshaw, A., Hares, J. D., Bell, P., Bradley, D., Carpenter, A. C., Dayton, M., Nagel, S. R., Claus, L., Porter, J., Rochau, G., Sanchez, M., Ivancic, S., Sorce, C., & Theobald, W. Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited). United States. doi:10.1063/1.5039648.
Engelhorn, K., Hilsabeck, T. J., Kilkenny, J., Morris, D., Chung, T. M., Dymoke-Bradshaw, A., Hares, J. D., Bell, P., Bradley, D., Carpenter, A. C., Dayton, M., Nagel, S. R., Claus, L., Porter, J., Rochau, G., Sanchez, M., Ivancic, S., Sorce, C., and Theobald, W. Mon . "Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited)". United States. doi:10.1063/1.5039648.
@article{osti_1477908,
title = {Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited)},
author = {Engelhorn, K. and Hilsabeck, T. J. and Kilkenny, J. and Morris, D. and Chung, T. M. and Dymoke-Bradshaw, A. and Hares, J. D. and Bell, P. and Bradley, D. and Carpenter, A. C. and Dayton, M. and Nagel, S. R. and Claus, L. and Porter, J. and Rochau, G. and Sanchez, M. and Ivancic, S. and Sorce, C. and Theobald, W.},
abstractNote = {},
doi = {10.1063/1.5039648},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {Mon Oct 01 00:00:00 EDT 2018},
month = {Mon Oct 01 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on October 17, 2019
Publisher's Accepted Manuscript

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Works referenced in this record:

An overview of the Ultrafast X-ray Imager (UXI) program at Sandia Labs
conference, August 2015

  • Claus, L.; Fang, L.; Kay, R.
  • SPIE Optical Engineering + Applications
  • DOI: 10.1117/12.2188336