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Title: The LAMP instrument at the Linac Coherent Light Source free-electron laser

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.5017727· OSTI ID:1437357
 [1];  [2];  [3];  [3];  [3];  [3];  [3]; ORCiD logo [4];  [5];  [5];  [6];  [4]
  1. Western Michigan Univ., Kalamazoo MI (United States). Dept. of Physics; SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS); Univ. of Connecticut, Storrs, CT (United States). Dept. of Physics
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS); Argonne National Lab. (ANL), Argonne, IL (United States). Chemical Sciences and Engineering Division
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS)
  4. Univ. of Connecticut, Storrs, CT (United States). Dept. of Physics
  5. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science; Kansas State Univ., Manhattan, KS (United States). J. R. Macdonald Lab.
  6. SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS); Synchrotron SOLEIL, Saint-Aubin (France)

The Laser Applications in Materials Processing (LAMP) instrument is a new end-station for soft X-ray imaging, high-field physics, and ultrafast X-ray science experiments that is available to users at the Linac Coherent Light Source (LCLS) free-electron laser. While the instrument resides in the Atomic, Molecular and Optical science hutch, its components can be used at any LCLS beamline. The end-station has a modular design that provides high flexibility in order to meet user-defined experimental requirements and specifications. The ultra-high-vacuum environment supports different sample delivery systems, including pulsed and continuous atomic, molecular, and cluster jets; liquid and aerosols jets; and effusive metal vapor beams. It also houses movable, large-format, high-speed pnCCD X-ray detectors for detecting scattered and fluorescent photons. Multiple charged-particle spectrometer options are compatible with the LAMP chamber, including a double-sided spectrometer for simultaneous and even coincident measurements of electrons, ions, and photons produced by the interaction of the high-intensity X-ray beam with the various samples. Here we describe the design and capabilities of the spectrometers along with some general aspects of the LAMP chamber and show some results from the initial instrument commissioning.

Research Organization:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Chemical Sciences, Geosciences, and Biosciences Division
Grant/Contract Number:
AC02-76SF00515; SC0002004; AC02-06CH11357
OSTI ID:
1437357
Alternate ID(s):
OSTI ID: 1429153; OSTI ID: 1477872
Journal Information:
Review of Scientific Instruments, Vol. 89, Issue 3; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 18 works
Citation information provided by
Web of Science

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Cited By (5)

Femtosecond-resolved observation of the fragmentation of buckminsterfullerene following X-ray multiphoton ionization journal September 2019
Electrospray sample injection for single-particle imaging with x-ray lasers journal May 2019
Evaluation of the performance of classification algorithms for XFEL single-particle imaging data text January 2019
Evaluation of the performance of classification algorithms for XFEL single-particle imaging data text January 2019
A Versatile Velocity Map Ion-Electron Covariance Imaging Spectrometer for High-Intensity XUV Experiments text January 2019


Figures / Tables (12)


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