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Title: Bi 2 Te 3 Wafers Inspection Update

Abstract

No abstract provided.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
KCP; USDOE
OSTI Identifier:
1477634
Report Number(s):
LA-UR-18-29725
DOE Contract Number:  
AC52-06NA25396
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English

Citation Formats

Greenhall, John James, Pantea, Cristian, Davis, Eric Sean, Chavez, Craig Alan, Sinha, Dipen N., Graham, Alan Lyman, Grutzik, Scott, Dumont, Joseph Henry, and Reardon, Patrick T. Bi2Te3 Wafers Inspection Update. United States: N. p., 2018. Web. doi:10.2172/1477634.
Greenhall, John James, Pantea, Cristian, Davis, Eric Sean, Chavez, Craig Alan, Sinha, Dipen N., Graham, Alan Lyman, Grutzik, Scott, Dumont, Joseph Henry, & Reardon, Patrick T. Bi2Te3 Wafers Inspection Update. United States. doi:10.2172/1477634.
Greenhall, John James, Pantea, Cristian, Davis, Eric Sean, Chavez, Craig Alan, Sinha, Dipen N., Graham, Alan Lyman, Grutzik, Scott, Dumont, Joseph Henry, and Reardon, Patrick T. Fri . "Bi2Te3 Wafers Inspection Update". United States. doi:10.2172/1477634. https://www.osti.gov/servlets/purl/1477634.
@article{osti_1477634,
title = {Bi2Te3 Wafers Inspection Update},
author = {Greenhall, John James and Pantea, Cristian and Davis, Eric Sean and Chavez, Craig Alan and Sinha, Dipen N. and Graham, Alan Lyman and Grutzik, Scott and Dumont, Joseph Henry and Reardon, Patrick T.},
abstractNote = {No abstract provided.},
doi = {10.2172/1477634},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {10}
}

Technical Report:

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