Micro-beam Laue alignment of multi-reflection Bragg coherent diffraction imaging measurements

Hofmann, Felix; Phillips, Nicholas W.; Harder, Ross J.; Liu, Wenjun; Clark, Jesse N.; Robinson, Ian K.; Abbey, Brian

doi:10.1107/S1600577517009183

Title: Micro-beam Laue alignment of multi-reflection Bragg coherent diffraction imaging measurements

Journal Article · Tue Aug 08 00:00:00 EDT 2017 · Journal of Synchrotron Radiation (Online)

DOI:https://doi.org/10.1107/S1600577517009183· OSTI ID:1376135

Hofmann, Felix ^[1];

^[2];

^[3]; Liu, Wenjun ^[3]; Clark, Jesse N. ^[4];

^[5]; Abbey, Brian ^[6]

Univ. of Oxford (United Kingdom). Department of Engineering Science
La Trobe University (Australia). Department of Chemistry and Physics; CSIRO Manufacturing Flagship, Parkville (Australia)
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford PULSE Institute
Brookhaven National Lab. (BNL), Upton, NY (United States)
La Trobe University (Australia). Department of Chemistry and Physics

Multi-reflection Bragg coherent diffraction imaging has the potential to allow three-dimensional (3D) resolved measurements of the full lattice strain tensor in specific micro-crystals. Until now such measurements were hampered by the need for laborious, time-intensive alignment procedures. Here a different approach is demonstrated, using micro-beam Laue X-ray diffraction to first determine the lattice orientation of the micro-crystal. This information is then used to rapidly align coherent diffraction measurements of three or more reflections from the crystal. Based on these, 3D strain and stress fields in the crystal are successfully determined. This approach is demonstrated on a focused ion beam milled micro-crystal from which six reflections could be measured. Since information from more than three independent reflections is available, the reliability of the phases retrieved from the coherent diffraction data can be assessed. Our results show that rapid, reliable 3D coherent diffraction measurements of the full lattice strain tensor in specific micro-crystals are now feasible and can be successfully carried out even in heavily distorted samples.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); Engineering and Physical Sciences Research Council (EPSRC); European Research Council (ERC); Argonne National Laboratory, Advanced Photon Source

Grant/Contract Number:: SC0012704; AC02-06CH11357

OSTI ID:: 1376135

Alternate ID(s):: OSTI ID: 1474149

Report Number(s):: BNL-114072-2017-JA; R&D Project: PO011; KC0201060

Journal Information:: Journal of Synchrotron Radiation (Online), Vol. 24, Issue 5; ISSN 1600-5775

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 23 works

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Mapping data between sample and detector conjugated spaces in Bragg coherent diffraction imaging Yang, David; Phillips, Nicholas W.; Hofmann, Felix Journal of Synchrotron Radiation, Vol. 26, Issue 6 https://doi.org/10.1107/s160057751901302x	journal	October 2019
Nano-scale imaging of the full strain tensor of specific dislocations extracted from a bulk sample Hofmann, Felix; Phillips, Nicholas W.; Das, Suchandrima arXiv https://doi.org/10.48550/arxiv.1903.04079	text	January 2019
Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging Richard, Marie-Ingrid; Fernández, Sara; Eymery, Joël Nanoscale, Vol. 10, Issue 10 https://doi.org/10.1039/c7nr07990g	journal	January 2018
Nanoscale imaging of the full strain tensor of specific dislocations extracted from a bulk sample Hofmann, Felix; Phillips, Nicholas W.; Das, Suchandrima Physical Review Materials, Vol. 4, Issue 1 https://doi.org/10.1103/physrevmaterials.4.013801	journal	January 2020
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