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Title: X-Ray Scattering Reveals Ion-Induced Microstructural Changes During Electrochemical Gating of Poly(3-Hexylthiophene)

Authors:
ORCiD logo [1];  [2];  [3];  [4]; ORCiD logo [5]; ORCiD logo [1]
  1. Materials Department, University of California, Santa Barbara, Santa Barbara CA 93106 USA
  2. The Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley CA 94720 USA
  3. Materials Department, University of California, Santa Barbara, Santa Barbara CA 93106 USA, Electronics Materials and New Energy Laboratory, Mitsubishi Chemical Corporation, Yokohama R&D Center 1000, Kamoshida-cho Aoba-ku Yokohama 227-8502 Japan
  4. Department of Chemical Engineering, University of California, Santa Barbara, Santa Barbara CA 93106 USA
  5. Materials Department, University of California, Santa Barbara, Santa Barbara CA 93106 USA, Department of Chemical Engineering, University of California, Santa Barbara, Santa Barbara CA 93106 USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1472162
Grant/Contract Number:  
SC0016390; AC02-05CH11231
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Advanced Functional Materials
Additional Journal Information:
Journal Name: Advanced Functional Materials Journal Volume: 28 Journal Issue: 44; Journal ID: ISSN 1616-301X
Publisher:
Wiley Blackwell (John Wiley & Sons)
Country of Publication:
Germany
Language:
English

Citation Formats

Thomas, Elayne M., Brady, Michael A., Nakayama, Hidenori, Popere, Bhooshan C., Segalman, Rachel A., and Chabinyc, Michael L.. X-Ray Scattering Reveals Ion-Induced Microstructural Changes During Electrochemical Gating of Poly(3-Hexylthiophene). Germany: N. p., 2018. Web. doi:10.1002/adfm.201803687.
Thomas, Elayne M., Brady, Michael A., Nakayama, Hidenori, Popere, Bhooshan C., Segalman, Rachel A., & Chabinyc, Michael L.. X-Ray Scattering Reveals Ion-Induced Microstructural Changes During Electrochemical Gating of Poly(3-Hexylthiophene). Germany. doi:10.1002/adfm.201803687.
Thomas, Elayne M., Brady, Michael A., Nakayama, Hidenori, Popere, Bhooshan C., Segalman, Rachel A., and Chabinyc, Michael L.. Mon . "X-Ray Scattering Reveals Ion-Induced Microstructural Changes During Electrochemical Gating of Poly(3-Hexylthiophene)". Germany. doi:10.1002/adfm.201803687.
@article{osti_1472162,
title = {X-Ray Scattering Reveals Ion-Induced Microstructural Changes During Electrochemical Gating of Poly(3-Hexylthiophene)},
author = {Thomas, Elayne M. and Brady, Michael A. and Nakayama, Hidenori and Popere, Bhooshan C. and Segalman, Rachel A. and Chabinyc, Michael L.},
abstractNote = {},
doi = {10.1002/adfm.201803687},
journal = {Advanced Functional Materials},
number = 44,
volume = 28,
place = {Germany},
year = {Mon Sep 17 00:00:00 EDT 2018},
month = {Mon Sep 17 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on September 17, 2019
Publisher's Accepted Manuscript

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Works referenced in this record:

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