Surface Characterization of NbTiN Films for Accelerator Applications

Conference · Sun Jul 01 00:00:00 EDT 2018

DOI:https://doi.org/10.18429/JACoW-IPAC2018-THPAL142· OSTI ID:1471378

Beverstock, David R. ^[1]; Kelley, Michael J. ^[1]; Reece, Charles E. ^[2]; Spradlin, Joshua K. ^[2]; Valente-Feliciano, Anne-Marie ^[2]

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1. College of William and Mary, Williamsburg, VA (United States); Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
2. Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)

The development of next-generation SRF cavities requires the deployment of innovative material solutions with RF performance beyond bulk Nb. Theoretical interest has stimulated efforts to grow and characterize thin multi-layer superconductor/insulator/superconductor (SIS) structures for their potential capability of supporting otherwise inaccessible surface magnetic fields in SRF cavities *. The ternary B1-compound NbTiN is among the candidate superconducting materials for SIS structures. Single crystal NbTiN films with thicknesses below 15 nm are also of interest for the development of high resolution, high sensitivity (SNSPD) detectors for particle physics application. Using DC reactive magnetron sputtering, NbTiN can be deposited with nominal superconducting parameters. This contribution presents the on-going material surface and superconducting properties characterization in order to optimize the NbTiN films for each application.

• Research Organization: Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Nuclear Physics (NP)
• DOE Contract Number: AC05-06OR23177
• OSTI ID: 1471378
• Report Number(s): JLAB-ACC-18-2718; DOE/OR/23177-4439
• Resource Relation: Conference: IPAC 2018, 29 Apr - 04 May 2018. Vancouver, BC Canada
• Country of Publication: United States
• Language: English