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Title: An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts

Abstract

Diamond X-ray detectors with conducting nitrogen-incorporated ultra-nanocrystalline diamond (N-UNCD) films as electrodes were fabricated to measure X-ray beam flux and position. Structural characterization and functionality tests were performed for these devices. The N-UNCD films grown on unseeded diamond substrates were compared with N-UNCD films grown on a seeded silicon substrate. Here, the feasibility of the N-UNCD films acting as electrodes for X-ray detectors was confirmed by the stable performance in a monochromatic X-ray beam. The fabrication process is able to change the surface status which may influence the signal uniformity under low bias, but this effect can be neglected under full collection bias.

Authors:
 [1];  [2];  [1];  [3];  [4];  [4];  [5];  [2];  [1]
  1. Stony Brook Univ., NY (United States). Materials Science and Chemical Engineering
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). Instrumentation Division
  3. Argonne National Lab. (ANL), Argonne, IL (United States). Center for Nanoscale Materials
  4. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
  5. Case Western Reserve Univ., Cleveland, OH (United States). Center for Synchrotron Biosciences, Dept. of Nutrition
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Nuclear Physics (NP) (SC-26); National Science Foundation (NSF)
OSTI Identifier:
1466596
Report Number(s):
BNL-207988-2018-JAAM
Journal ID: ISSN 1600-5775; JSYRES
Grant/Contract Number:  
SC0012704; AC02-98CH10886; AC02-06CH11357
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 25; Journal Issue: 4; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; X-ray detector; beam position monitor; diamond; ultra-nanocrystalline; flux monitor

Citation Formats

Zou, Mengnan, Gaowei, Mengjia, Zhou, Tianyi, Sumant, Anirudha V., Jaye, Cherno, Fisher, Daniel A., Bohon, Jen, Smedley, John, and Muller, Erik M.. An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts. United States: N. p., 2018. Web. doi:10.1107/S1600577518006318.
Zou, Mengnan, Gaowei, Mengjia, Zhou, Tianyi, Sumant, Anirudha V., Jaye, Cherno, Fisher, Daniel A., Bohon, Jen, Smedley, John, & Muller, Erik M.. An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts. United States. doi:10.1107/S1600577518006318.
Zou, Mengnan, Gaowei, Mengjia, Zhou, Tianyi, Sumant, Anirudha V., Jaye, Cherno, Fisher, Daniel A., Bohon, Jen, Smedley, John, and Muller, Erik M.. Thu . "An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts". United States. doi:10.1107/S1600577518006318.
@article{osti_1466596,
title = {An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts},
author = {Zou, Mengnan and Gaowei, Mengjia and Zhou, Tianyi and Sumant, Anirudha V. and Jaye, Cherno and Fisher, Daniel A. and Bohon, Jen and Smedley, John and Muller, Erik M.},
abstractNote = {Diamond X-ray detectors with conducting nitrogen-incorporated ultra-nanocrystalline diamond (N-UNCD) films as electrodes were fabricated to measure X-ray beam flux and position. Structural characterization and functionality tests were performed for these devices. The N-UNCD films grown on unseeded diamond substrates were compared with N-UNCD films grown on a seeded silicon substrate. Here, the feasibility of the N-UNCD films acting as electrodes for X-ray detectors was confirmed by the stable performance in a monochromatic X-ray beam. The fabrication process is able to change the surface status which may influence the signal uniformity under low bias, but this effect can be neglected under full collection bias.},
doi = {10.1107/S1600577518006318},
journal = {Journal of Synchrotron Radiation (Online)},
number = 4,
volume = 25,
place = {United States},
year = {Thu May 31 00:00:00 EDT 2018},
month = {Thu May 31 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
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Works referenced in this record:

The CVD of Nanodiamond Materials
journal, July 2008

  • Butler, James E.; Sumant, Anirudha V.; Barnard, Amanda S.
  • Chemical Vapor Deposition, Vol. 14, Issue 7-8, p. 145-160
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Synthesis and characterization of highly-conducting nitrogen-doped ultrananocrystalline diamond films
journal, September 2001

  • Bhattacharyya, S.; Auciello, O.; Birrell, J.
  • Applied Physics Letters, Vol. 79, Issue 10, p. 1441-1443
  • DOI: 10.1063/1.1400761

X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92
journal, July 1993

  • Henke, B. L.; Gullikson, E. M.; Davis, J. C.
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