Investigation of temperature approximation methods during flash sintering of ZnO
Abstract
The lattice expansion in ZnO, using in-situ X ray diffraction, has been investigated during flash sintering with varying current densities. While current flow through the specimen enhances the kinetics of sintering for ZnO, the temperature is not high enough to claim thermal runaway or localized melting. Unlike the case of yttria stabilized zirconia [1,2], experimental temperature approximations predict comparable specimen temperature to conventional sintering temperature of ZnO. Microstructural analysis supports the findings of the in-situ temperature approximations. In comparison with black body radiation, a gap between theoretical value and measured value was found due to flaws in the theoretical model. In addition, a new type of flash sintering was introduced, with current ramp, to avoid the power spike which has been the source of much debate about the transition from voltage to current control. In conclusion, the advantage of this method is in the controlled sintering kinetics thus avoiding the channeling found in dielectric materials [3].
- Authors:
-
- Rutgers Univ., New Brunswick, NJ (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- US Department of the Navy, Office of Naval Research (ONR); USDOE
- OSTI Identifier:
- 1466312
- Alternate Identifier(s):
- OSTI ID: 1691773
- Grant/Contract Number:
- AC02-06CH11357
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- Ceramics International
- Additional Journal Information:
- Journal Volume: 44; Journal Issue: 6; Journal ID: ISSN 0272-8842
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; ZnO; blackbody radiation; flash; in situ diffraction; sintering; zinc oxide
Citation Formats
Charalambous, Harry, Jha, Shikhar Krishn, Lay, Ryan T., Cabales, Avaniek, Okasinski, John, and Tsakalakos, Thomas. Investigation of temperature approximation methods during flash sintering of ZnO. United States: N. p., 2018.
Web. doi:10.1016/j.ceramint.2017.12.250.
Charalambous, Harry, Jha, Shikhar Krishn, Lay, Ryan T., Cabales, Avaniek, Okasinski, John, & Tsakalakos, Thomas. Investigation of temperature approximation methods during flash sintering of ZnO. United States. https://doi.org/10.1016/j.ceramint.2017.12.250
Charalambous, Harry, Jha, Shikhar Krishn, Lay, Ryan T., Cabales, Avaniek, Okasinski, John, and Tsakalakos, Thomas. 2018.
"Investigation of temperature approximation methods during flash sintering of ZnO". United States. https://doi.org/10.1016/j.ceramint.2017.12.250. https://www.osti.gov/servlets/purl/1466312.
@article{osti_1466312,
title = {Investigation of temperature approximation methods during flash sintering of ZnO},
author = {Charalambous, Harry and Jha, Shikhar Krishn and Lay, Ryan T. and Cabales, Avaniek and Okasinski, John and Tsakalakos, Thomas},
abstractNote = {The lattice expansion in ZnO, using in-situ X ray diffraction, has been investigated during flash sintering with varying current densities. While current flow through the specimen enhances the kinetics of sintering for ZnO, the temperature is not high enough to claim thermal runaway or localized melting. Unlike the case of yttria stabilized zirconia [1,2], experimental temperature approximations predict comparable specimen temperature to conventional sintering temperature of ZnO. Microstructural analysis supports the findings of the in-situ temperature approximations. In comparison with black body radiation, a gap between theoretical value and measured value was found due to flaws in the theoretical model. In addition, a new type of flash sintering was introduced, with current ramp, to avoid the power spike which has been the source of much debate about the transition from voltage to current control. In conclusion, the advantage of this method is in the controlled sintering kinetics thus avoiding the channeling found in dielectric materials [3].},
doi = {10.1016/j.ceramint.2017.12.250},
url = {https://www.osti.gov/biblio/1466312},
journal = {Ceramics International},
issn = {0272-8842},
number = 6,
volume = 44,
place = {United States},
year = {Thu Jan 04 00:00:00 EST 2018},
month = {Thu Jan 04 00:00:00 EST 2018}
}
Web of Science
Figures / Tables:
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