Using integrated data analysis to extend measurement capability (invited)

Reusch, L. M.; Nornberg, M. D.; Goetz, J. A.; Den Hartog, D. J.

doi:10.1063/1.5039349

Title: Using integrated data analysis to extend measurement capability (invited)

Journal Article · Fri Aug 10 00:00:00 EDT 2018 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.5039349· OSTI ID:1464938

Reusch, L. M. ^[1];

^[1]; Goetz, J. A. ^[1]; Den Hartog, D. J. ^[1]

Univ. of Wisconsin, Madison, WI (United States)

The analysis approach called integrated data analysis (IDA) provides a means to exploit all information present in multiple streams of raw data to produce the best inference of a plasma parameter. This contrasts with the typical approach in which information (data) from a single diagnostic is used to measure a given parameter, e.g., visible bremsstrahlung → Z_eff. Data from a given diagnostic usually contain information on many parameters. For example, a Thomson scattering diagnostic is sensitive to bremsstrahlung and line emission in addition to electron temperature. This background light is typically subtracted off and discarded but could be used to improve knowledge of Z_eff. IDA encourages explicit awareness of such information and provides the quantitative framework to exploit it. This gives IDA the ability to increase spatial and temporal resolution, increase precision and accuracy of inferences, and measure plasma parameters that are difficult or impossible to measure using single diagnostic techniques. One example is the measurement of Z_eff on Madison symmetric torus using IDA since no single diagnostic can provide a robust measurement. Thus, as we enter the burning plasma era, application of IDA will be critical to the measurement of certain parameters, as diagnostic access in the harsh fusion environment will be extremely limited.

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Research Organization:: Univ. of Wisconsin, Madison, WI (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Fusion Energy Sciences (FES)

Grant/Contract Number:: FC02-05ER54814; SC0015474

OSTI ID:: 1464938

Alternate ID(s):: OSTI ID: 1463942

Journal Information:: Review of Scientific Instruments, Vol. 89, Issue 10; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 3 works

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