Quantitative Electroluminescence Imaging Analysis for Performance Estimation of PID-Influenced PV Modules
Abstract
An empirical method for estimating relative power losses caused by potential-induced degradation (PID) for p-type solar cells and modules using quantitative electroluminescence (EL) analysis (QELA) is presented. First, EL images are corrected for camera- and perspective distortion. The relative power loss map is then calculated from the logarithmic ratio of two EL images, taken either before and after PID degradation or at different applied currents. Only the cell average of the resulting power loss map is evaluated. The highest power loss across each string is averaged to obtain the overall power loss. Consequently, for modules with three strings, three cells are averaged. The resulting power loss depends on the current applied. The conversion to equivalent irradiance allows for comparison of measured and estimated device performance. The analysis of roughly 2000 EL images and related current-voltage (I-V) curves indicates a good agreement between flash-test-measured and performance estimated using QELA. A relative root mean square error of 1-3% can be achieved.
- Authors:
-
- Solar Energy Research Inst. of Singapore (Singapore)
- Trina Solar, Changzhou (China)
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Publication Date:
- Research Org.:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- OSTI Identifier:
- 1464918
- Report Number(s):
- NREL/JA-5K00-72198
Journal ID: ISSN 2156-3381
- Grant/Contract Number:
- AC36-08GO28308
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- IEEE Journal of Photovoltaics
- Additional Journal Information:
- Journal Volume: 8; Journal Issue: 5; Journal ID: ISSN 2156-3381
- Publisher:
- IEEE
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; 36 MATERIALS SCIENCE; electroluminescence (EL); metrology; performance evaluation; photovoltaic (PV) modules; potential-induced degradation (PID); solar cells
Citation Formats
Bedrich, Karl G., Luo, Wei, Pravettoni, Mauro, Chen, Daming, Chen, Yifeng, Wang, Zigang, Verlinden, Pierre J., Hacke, Peter, Feng, Zhiqiang, Chai, Jing, Wang, Yan, Aberle, Armin G., and Khoo, Yong Sheng. Quantitative Electroluminescence Imaging Analysis for Performance Estimation of PID-Influenced PV Modules. United States: N. p., 2018.
Web. doi:10.1109/JPHOTOV.2018.2846665.
Bedrich, Karl G., Luo, Wei, Pravettoni, Mauro, Chen, Daming, Chen, Yifeng, Wang, Zigang, Verlinden, Pierre J., Hacke, Peter, Feng, Zhiqiang, Chai, Jing, Wang, Yan, Aberle, Armin G., & Khoo, Yong Sheng. Quantitative Electroluminescence Imaging Analysis for Performance Estimation of PID-Influenced PV Modules. United States. https://doi.org/10.1109/JPHOTOV.2018.2846665
Bedrich, Karl G., Luo, Wei, Pravettoni, Mauro, Chen, Daming, Chen, Yifeng, Wang, Zigang, Verlinden, Pierre J., Hacke, Peter, Feng, Zhiqiang, Chai, Jing, Wang, Yan, Aberle, Armin G., and Khoo, Yong Sheng. 2018.
"Quantitative Electroluminescence Imaging Analysis for Performance Estimation of PID-Influenced PV Modules". United States. https://doi.org/10.1109/JPHOTOV.2018.2846665. https://www.osti.gov/servlets/purl/1464918.
@article{osti_1464918,
title = {Quantitative Electroluminescence Imaging Analysis for Performance Estimation of PID-Influenced PV Modules},
author = {Bedrich, Karl G. and Luo, Wei and Pravettoni, Mauro and Chen, Daming and Chen, Yifeng and Wang, Zigang and Verlinden, Pierre J. and Hacke, Peter and Feng, Zhiqiang and Chai, Jing and Wang, Yan and Aberle, Armin G. and Khoo, Yong Sheng},
abstractNote = {An empirical method for estimating relative power losses caused by potential-induced degradation (PID) for p-type solar cells and modules using quantitative electroluminescence (EL) analysis (QELA) is presented. First, EL images are corrected for camera- and perspective distortion. The relative power loss map is then calculated from the logarithmic ratio of two EL images, taken either before and after PID degradation or at different applied currents. Only the cell average of the resulting power loss map is evaluated. The highest power loss across each string is averaged to obtain the overall power loss. Consequently, for modules with three strings, three cells are averaged. The resulting power loss depends on the current applied. The conversion to equivalent irradiance allows for comparison of measured and estimated device performance. The analysis of roughly 2000 EL images and related current-voltage (I-V) curves indicates a good agreement between flash-test-measured and performance estimated using QELA. A relative root mean square error of 1-3% can be achieved.},
doi = {10.1109/JPHOTOV.2018.2846665},
url = {https://www.osti.gov/biblio/1464918},
journal = {IEEE Journal of Photovoltaics},
issn = {2156-3381},
number = 5,
volume = 8,
place = {United States},
year = {Fri Jul 13 00:00:00 EDT 2018},
month = {Fri Jul 13 00:00:00 EDT 2018}
}
Web of Science