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Title: Leveraging Multi-Channel Detector Technology to Improve Quality Metrics for Industrial and Security Applications.

Abstract

Abstract not provided.

Authors:
; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1464438
Report Number(s):
SAND2017-8411C
656034
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the SPIE Optics+Photonics held August 5-11, 2017 in San diego, ca.
Country of Publication:
United States
Language:
English

Citation Formats

Jimenez, Edward Steven,, Thompson, Kyle R., Goodner, Ryan Nicolas, Stohn, Adriana, and Tran, Tina. Leveraging Multi-Channel Detector Technology to Improve Quality Metrics for Industrial and Security Applications.. United States: N. p., 2017. Web. doi:10.1117/12.2275850.
Jimenez, Edward Steven,, Thompson, Kyle R., Goodner, Ryan Nicolas, Stohn, Adriana, & Tran, Tina. Leveraging Multi-Channel Detector Technology to Improve Quality Metrics for Industrial and Security Applications.. United States. doi:10.1117/12.2275850.
Jimenez, Edward Steven,, Thompson, Kyle R., Goodner, Ryan Nicolas, Stohn, Adriana, and Tran, Tina. Tue . "Leveraging Multi-Channel Detector Technology to Improve Quality Metrics for Industrial and Security Applications.". United States. doi:10.1117/12.2275850. https://www.osti.gov/servlets/purl/1464438.
@article{osti_1464438,
title = {Leveraging Multi-Channel Detector Technology to Improve Quality Metrics for Industrial and Security Applications.},
author = {Jimenez, Edward Steven, and Thompson, Kyle R. and Goodner, Ryan Nicolas and Stohn, Adriana and Tran, Tina},
abstractNote = {Abstract not provided.},
doi = {10.1117/12.2275850},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2017},
month = {8}
}

Conference:
Other availability
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Works referenced in this record:

Practical cone-beam algorithm
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  • Journal of the Optical Society of America A, Vol. 1, Issue 6
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Technical principles of dual energy X-ray absorptiometry
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K-edge imaging in x-ray computed tomography using multi-bin photon counting detectors
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