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Title: Data Analysis using Psocake at PAL-XFEL

Authors:
; ;
Publication Date:
Research Org.:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1463358
DOE Contract Number:  
AC02-76SF00515
Resource Type:
Journal Article
Journal Name:
Journal of the Korean Physical Society
Additional Journal Information:
Journal Volume: 73; Journal Issue: 1; Journal ID: ISSN 0374-4884
Country of Publication:
United States
Language:
English

Citation Formats

Shin, Hocheol, Kim, Seungnam, and Yoon, Chun Hong. Data Analysis using Psocake at PAL-XFEL. United States: N. p., 2018. Web. doi:10.3938/jkps.73.16.
Shin, Hocheol, Kim, Seungnam, & Yoon, Chun Hong. Data Analysis using Psocake at PAL-XFEL. United States. https://doi.org/10.3938/jkps.73.16
Shin, Hocheol, Kim, Seungnam, and Yoon, Chun Hong. 2018. "Data Analysis using Psocake at PAL-XFEL". United States. https://doi.org/10.3938/jkps.73.16.
@article{osti_1463358,
title = {Data Analysis using Psocake at PAL-XFEL},
author = {Shin, Hocheol and Kim, Seungnam and Yoon, Chun Hong},
abstractNote = {},
doi = {10.3938/jkps.73.16},
url = {https://www.osti.gov/biblio/1463358}, journal = {Journal of the Korean Physical Society},
issn = {0374-4884},
number = 1,
volume = 73,
place = {United States},
year = {Sun Jul 01 00:00:00 EDT 2018},
month = {Sun Jul 01 00:00:00 EDT 2018}
}

Works referencing / citing this record:

Processing serial crystallography data with CrystFEL : a step-by-step guide
text, January 2019