Development of combined microstructure and structure characterization facility for in situ and operando studies at the Advanced Photon Source

Ilavsky, Jan; Zhang, Fan; Andrews, Ross N.; Kuzmenko, Ivan; Jemian, Pete R.; Levine, Lyle E.; Allen, Andrew J.

doi:10.1107/S160057671800643X

Title: Development of combined microstructure and structure characterization facility for in situ and operando studies at the Advanced Photon Source

Journal Article · Fri Jun 01 00:00:00 EDT 2018 · Journal of Applied Crystallography (Online)

DOI:https://doi.org/10.1107/S160057671800643X· OSTI ID:1461530

Ilavsky, Jan ^[1]; Zhang, Fan ^[2]; Andrews, Ross N. ^[3]; Kuzmenko, Ivan ^[1]; Jemian, Pete R. ^[1]; Levine, Lyle E. ^[2];

^[2]

Argonne National Lab. (ANL), Argonne, IL (United States)
National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
Argonne National Lab. (ANL), Argonne, IL (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Following many years of evolutionary development, first at the National Synchrotron Light Source, Brookhaven National Laboratory, and then at the Advanced Photon Source (APS), Argonne National Laboratory, the APS ultra-small-angle X-ray scattering (USAXS) facility has been transformed by several new developments. These comprise a conversion to higher-order crystal optics and higher X-ray energies as the standard operating mode, rapid fly scan measurements also as a standard operational mode, automated contiguous pinhole small-angle X-ray scattering (SAXS) measurements at intermediate scattering vectors, and associated rapid wide-angle X-ray scattering (WAXS) measurements for X-ray diffraction without disturbing the sample geometry. With each mode using the USAXS incident beam optics upstream of the sample, USAXS/SAXS/WAXS measurements can now be made within 5 min, allowing in situ and operando measurement capabilities with great flexibility under a wide range of sample conditions. Furthermore, these developments are described, together with examples of their application to investigate materials phenomena of technological importance. Developments of two novel USAXS applications, USAXS-based X-ray photon correlation spectroscopy and USAXS imaging, are also briefly reviewed.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Sustainable Transportation Office. Hydrogen Fuel Cell Technologies Office (HFTO)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1461530

Journal Information:: Journal of Applied Crystallography (Online), Vol. 51, Issue 3; ISSN 1600-5767

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 111 works

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