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Title: Development of combined microstructure and structure characterization facility for in situ and operando studies at the Advanced Photon Source

Abstract

Following many years of evolutionary development, first at the National Synchrotron Light Source, Brookhaven National Laboratory, and then at the Advanced Photon Source (APS), Argonne National Laboratory, the APS ultra-small-angle X-ray scattering (USAXS) facility has been transformed by several new developments. These comprise a conversion to higher-order crystal optics and higher X-ray energies as the standard operating mode, rapid fly scan measurements also as a standard operational mode, automated contiguous pinhole small-angle X-ray scattering (SAXS) measurements at intermediate scattering vectors, and associated rapid wide-angle X-ray scattering (WAXS) measurements for X-ray diffraction without disturbing the sample geometry. With each mode using the USAXS incident beam optics upstream of the sample, USAXS/SAXS/WAXS measurements can now be made within 5 min, allowing in situ and operando measurement capabilities with great flexibility under a wide range of sample conditions. Furthermore, these developments are described, together with examples of their application to investigate materials phenomena of technological importance. Developments of two novel USAXS applications, USAXS-based X-ray photon correlation spectroscopy and USAXS imaging, are also briefly reviewed.

Authors:
 [1];  [2];  [3];  [1];  [1];  [2]; ORCiD logo [2]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
  2. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Fuel Cell Technologies Office (EE-3F)
OSTI Identifier:
1461530
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Applied Crystallography (Online)
Additional Journal Information:
Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 51; Journal Issue: 3; Journal ID: ISSN 1600-5767
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; small-angle X-ray scattering; X-ray diffraction; microstructure characterization; in situ studies

Citation Formats

Ilavsky, Jan, Zhang, Fan, Andrews, Ross N., Kuzmenko, Ivan, Jemian, Pete R., Levine, Lyle E., and Allen, Andrew J. Development of combined microstructure and structure characterization facility for in situ and operando studies at the Advanced Photon Source. United States: N. p., 2018. Web. doi:10.1107/S160057671800643X.
Ilavsky, Jan, Zhang, Fan, Andrews, Ross N., Kuzmenko, Ivan, Jemian, Pete R., Levine, Lyle E., & Allen, Andrew J. Development of combined microstructure and structure characterization facility for in situ and operando studies at the Advanced Photon Source. United States. doi:10.1107/S160057671800643X.
Ilavsky, Jan, Zhang, Fan, Andrews, Ross N., Kuzmenko, Ivan, Jemian, Pete R., Levine, Lyle E., and Allen, Andrew J. Fri . "Development of combined microstructure and structure characterization facility for in situ and operando studies at the Advanced Photon Source". United States. doi:10.1107/S160057671800643X.
@article{osti_1461530,
title = {Development of combined microstructure and structure characterization facility for in situ and operando studies at the Advanced Photon Source},
author = {Ilavsky, Jan and Zhang, Fan and Andrews, Ross N. and Kuzmenko, Ivan and Jemian, Pete R. and Levine, Lyle E. and Allen, Andrew J.},
abstractNote = {Following many years of evolutionary development, first at the National Synchrotron Light Source, Brookhaven National Laboratory, and then at the Advanced Photon Source (APS), Argonne National Laboratory, the APS ultra-small-angle X-ray scattering (USAXS) facility has been transformed by several new developments. These comprise a conversion to higher-order crystal optics and higher X-ray energies as the standard operating mode, rapid fly scan measurements also as a standard operational mode, automated contiguous pinhole small-angle X-ray scattering (SAXS) measurements at intermediate scattering vectors, and associated rapid wide-angle X-ray scattering (WAXS) measurements for X-ray diffraction without disturbing the sample geometry. With each mode using the USAXS incident beam optics upstream of the sample, USAXS/SAXS/WAXS measurements can now be made within 5 min, allowing in situ and operando measurement capabilities with great flexibility under a wide range of sample conditions. Furthermore, these developments are described, together with examples of their application to investigate materials phenomena of technological importance. Developments of two novel USAXS applications, USAXS-based X-ray photon correlation spectroscopy and USAXS imaging, are also briefly reviewed.},
doi = {10.1107/S160057671800643X},
journal = {Journal of Applied Crystallography (Online)},
number = 3,
volume = 51,
place = {United States},
year = {Fri Jun 01 00:00:00 EDT 2018},
month = {Fri Jun 01 00:00:00 EDT 2018}
}

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