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Title: Atomic Force Microscopy Beyond the Standard Quantum Limit

Abstract

We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.

Authors:
ORCiD logo [1]; ORCiD logo [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1461044
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: CLEO: Applications and Technology 2018 - San Jose, California, United States of America - 5/13/2018 12:00:00 PM-5/18/2018 12:00:00 PM
Country of Publication:
United States
Language:
English

Citation Formats

Lawrie, Benjamin J., and Pooser, Raphael C. Atomic Force Microscopy Beyond the Standard Quantum Limit. United States: N. p., 2018. Web. doi:10.1364/CLEO_AT.2018.JF2B.3.
Lawrie, Benjamin J., & Pooser, Raphael C. Atomic Force Microscopy Beyond the Standard Quantum Limit. United States. doi:10.1364/CLEO_AT.2018.JF2B.3.
Lawrie, Benjamin J., and Pooser, Raphael C. Tue . "Atomic Force Microscopy Beyond the Standard Quantum Limit". United States. doi:10.1364/CLEO_AT.2018.JF2B.3. https://www.osti.gov/servlets/purl/1461044.
@article{osti_1461044,
title = {Atomic Force Microscopy Beyond the Standard Quantum Limit},
author = {Lawrie, Benjamin J. and Pooser, Raphael C.},
abstractNote = {We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.},
doi = {10.1364/CLEO_AT.2018.JF2B.3},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {5}
}

Conference:
Other availability
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