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Title: Enhanced spin polarization of amorphous F e x S i 1 x thin films revealed by Andreev reflection spectroscopy

Authors:
; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1457499
Grant/Contract Number:  
AC02-05-CH11231; SC0012670; FG0205ER46237
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Physical Review Materials
Additional Journal Information:
Journal Name: Physical Review Materials Journal Volume: 2 Journal Issue: 6; Journal ID: ISSN 2475-9953
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Karel, J., Bouma, D. S., Martinez, J., Zhang, Y. N., Gifford, J. A., Zhang, J., Zhao, G. J., Kim, D. R., Li, B. C., Huang, Z. Y., Wu, R. Q., Chen, T. Y., and Hellman, F. Enhanced spin polarization of amorphous F e x S i 1 − x thin films revealed by Andreev reflection spectroscopy. United States: N. p., 2018. Web. doi:10.1103/PhysRevMaterials.2.064411.
Karel, J., Bouma, D. S., Martinez, J., Zhang, Y. N., Gifford, J. A., Zhang, J., Zhao, G. J., Kim, D. R., Li, B. C., Huang, Z. Y., Wu, R. Q., Chen, T. Y., & Hellman, F. Enhanced spin polarization of amorphous F e x S i 1 − x thin films revealed by Andreev reflection spectroscopy. United States. doi:10.1103/PhysRevMaterials.2.064411.
Karel, J., Bouma, D. S., Martinez, J., Zhang, Y. N., Gifford, J. A., Zhang, J., Zhao, G. J., Kim, D. R., Li, B. C., Huang, Z. Y., Wu, R. Q., Chen, T. Y., and Hellman, F. Wed . "Enhanced spin polarization of amorphous F e x S i 1 − x thin films revealed by Andreev reflection spectroscopy". United States. doi:10.1103/PhysRevMaterials.2.064411.
@article{osti_1457499,
title = {Enhanced spin polarization of amorphous F e x S i 1 − x thin films revealed by Andreev reflection spectroscopy},
author = {Karel, J. and Bouma, D. S. and Martinez, J. and Zhang, Y. N. and Gifford, J. A. and Zhang, J. and Zhao, G. J. and Kim, D. R. and Li, B. C. and Huang, Z. Y. and Wu, R. Q. and Chen, T. Y. and Hellman, F.},
abstractNote = {},
doi = {10.1103/PhysRevMaterials.2.064411},
journal = {Physical Review Materials},
number = 6,
volume = 2,
place = {United States},
year = {Wed Jun 27 00:00:00 EDT 2018},
month = {Wed Jun 27 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on June 27, 2019
Publisher's Accepted Manuscript

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