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Title: Electron reflection effects on particle and heat fluxes to positively charged dust subject to strong electron emission

Authors:
 [1];  [2]; ORCiD logo [1];  [1]
  1. Space and Plasma Physics, KTH Royal Institute of Technology, SE-100 44 Stockholm, Sweden
  2. Theoretical Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1454349
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Physics of Plasmas
Additional Journal Information:
Journal Name: Physics of Plasmas Journal Volume: 25 Journal Issue: 6; Journal ID: ISSN 1070-664X
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Vignitchouk, L., Delzanno, G. L., Tolias, P., and Ratynskaia, S.. Electron reflection effects on particle and heat fluxes to positively charged dust subject to strong electron emission. United States: N. p., 2018. Web. doi:10.1063/1.5026384.
Vignitchouk, L., Delzanno, G. L., Tolias, P., & Ratynskaia, S.. Electron reflection effects on particle and heat fluxes to positively charged dust subject to strong electron emission. United States. doi:10.1063/1.5026384.
Vignitchouk, L., Delzanno, G. L., Tolias, P., and Ratynskaia, S.. Fri . "Electron reflection effects on particle and heat fluxes to positively charged dust subject to strong electron emission". United States. doi:10.1063/1.5026384.
@article{osti_1454349,
title = {Electron reflection effects on particle and heat fluxes to positively charged dust subject to strong electron emission},
author = {Vignitchouk, L. and Delzanno, G. L. and Tolias, P. and Ratynskaia, S.},
abstractNote = {},
doi = {10.1063/1.5026384},
journal = {Physics of Plasmas},
number = 6,
volume = 25,
place = {United States},
year = {Fri Jun 01 00:00:00 EDT 2018},
month = {Fri Jun 01 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on June 13, 2019
Publisher's Accepted Manuscript

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