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Title: Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source

Abstract

In anticipation of the increased use of coherent X-ray methods and the need to upgrade beamlines to match improved source quality, here the coherence properties of the X-rays delivered by beamline 12ID-D at the Advanced Photon Source have been characterized. The measured X-ray divergence, beam size, brightness and coherent flux at energies up to 26 keV are compared with the calculated values from the undulator source, and the effects of beamline optics such as a mirror, monochromator and compound refractive lenses are evaluated. Diffraction patterns from slits as a function of slit width are analyzed using wave propagation theory to obtain the beam divergence and thus coherence length. Imaging of the source using a compound refractive lens was found to be the most accurate method for determining the vertical divergence. While the brightness and coherent flux obtained without a monochromator ('pink beam') agree well with those calculated for the source, those measured with the monochromator were a factor of three to six lower than the source, primarily because of vertical divergence introduced by the monochromator. As a result, the methods described herein should be widely applicable for measuring the X-ray coherence properties of synchrotron beamlines.

Authors:
 [1];  [1];  [2];  [1];  [3];  [1];  [1];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
  2. Northern Illinois Univ., DeKalb, IL (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division
OSTI Identifier:
1454336
Alternate Identifier(s):
OSTI ID: 1454505
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article: Published Article
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 25; Journal Issue: 4; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS; coherence; divergence; brightness

Citation Formats

Ju, Guangxu, Highland, Matthew J., Thompson, Carol, Eastman, Jeffrey A., Fuoss, Paul H., Zhou, Hua, Dejus, Roger, and Stephenson, G. Brian. Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source. United States: N. p., 2018. Web. doi:10.1107/S1600577518006501.
Ju, Guangxu, Highland, Matthew J., Thompson, Carol, Eastman, Jeffrey A., Fuoss, Paul H., Zhou, Hua, Dejus, Roger, & Stephenson, G. Brian. Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source. United States. doi:10.1107/S1600577518006501.
Ju, Guangxu, Highland, Matthew J., Thompson, Carol, Eastman, Jeffrey A., Fuoss, Paul H., Zhou, Hua, Dejus, Roger, and Stephenson, G. Brian. Wed . "Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source". United States. doi:10.1107/S1600577518006501.
@article{osti_1454336,
title = {Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source},
author = {Ju, Guangxu and Highland, Matthew J. and Thompson, Carol and Eastman, Jeffrey A. and Fuoss, Paul H. and Zhou, Hua and Dejus, Roger and Stephenson, G. Brian},
abstractNote = {In anticipation of the increased use of coherent X-ray methods and the need to upgrade beamlines to match improved source quality, here the coherence properties of the X-rays delivered by beamline 12ID-D at the Advanced Photon Source have been characterized. The measured X-ray divergence, beam size, brightness and coherent flux at energies up to 26 keV are compared with the calculated values from the undulator source, and the effects of beamline optics such as a mirror, monochromator and compound refractive lenses are evaluated. Diffraction patterns from slits as a function of slit width are analyzed using wave propagation theory to obtain the beam divergence and thus coherence length. Imaging of the source using a compound refractive lens was found to be the most accurate method for determining the vertical divergence. While the brightness and coherent flux obtained without a monochromator ('pink beam') agree well with those calculated for the source, those measured with the monochromator were a factor of three to six lower than the source, primarily because of vertical divergence introduced by the monochromator. As a result, the methods described herein should be widely applicable for measuring the X-ray coherence properties of synchrotron beamlines.},
doi = {10.1107/S1600577518006501},
journal = {Journal of Synchrotron Radiation (Online)},
number = 4,
volume = 25,
place = {United States},
year = {Wed Jun 13 00:00:00 EDT 2018},
month = {Wed Jun 13 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1107/S1600577518006501

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