An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts

Zou, Mengnan; Gaowei, Mengjia; Zhou, Tianyi; Sumant, Anirudha V.; Jaye, Cherno; Fisher, Daniel A.; Bohon, Jen; Smedley, John; Muller, Erik M.

doi:10.1107/S1600577518006318

Title: An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts

Journal Article · Thu May 31 00:00:00 EDT 2018 · Journal of Synchrotron Radiation (Online)

DOI:https://doi.org/10.1107/S1600577518006318· OSTI ID:1440968

Zou, Mengnan; Gaowei, Mengjia; Zhou, Tianyi; Sumant, Anirudha V.; Jaye, Cherno; Fisher, Daniel A.; Bohon, Jen; Smedley, John; Muller, Erik M.

Diamond X-ray detectors with conducting nitrogen-incorporated ultra-nanocrystalline diamond (N-UNCD) films as electrodes were fabricated to measure X-ray beam flux and position. Structural characterization and functionality tests were performed for these devices. The N-UNCD films grown on unseeded diamond substrates were compared with N-UNCD films grown on a seeded silicon substrate. The feasibility of the N-UNCD films acting as electrodes for X-ray detectors was confirmed by the stable performance in a monochromatic X-ray beam. The fabrication process is able to change the surface status which may influence the signal uniformity under low bias, but this effect can be neglected under full collection bias.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Institutes of Health (NIH); National Science Foundation (NSF)

DOE Contract Number:: AC02-06CH11357

OSTI ID:: 1440968

Journal Information:: Journal of Synchrotron Radiation (Online), Vol. 25, Issue 4; ISSN 1600-5775

Publisher:: International Union of Crystallography

Country of Publication:: United States

Language:: English

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