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Title: An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts

Abstract

Diamond X-ray detectors with conducting nitrogen-incorporated ultra-nanocrystalline diamond (N-UNCD) films as electrodes were fabricated to measure X-ray beam flux and position. Structural characterization and functionality tests were performed for these devices. The N-UNCD films grown on unseeded diamond substrates were compared with N-UNCD films grown on a seeded silicon substrate. The feasibility of the N-UNCD films acting as electrodes for X-ray detectors was confirmed by the stable performance in a monochromatic X-ray beam. The fabrication process is able to change the surface status which may influence the signal uniformity under low bias, but this effect can be neglected under full collection bias.

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Institutes of Health (NIH); National Science Foundation (NSF)
OSTI Identifier:
1440968
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Volume: 25; Journal Issue: 4; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
beam position monitor; X-ray detector; diamond; flux monitor; ultra-nanocrystalline

Citation Formats

Zou, Mengnan, Gaowei, Mengjia, Zhou, Tianyi, Sumant, Anirudha V., Jaye, Cherno, Fisher, Daniel A., Bohon, Jen, Smedley, John, and Muller, Erik M. An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts. United States: N. p., 2018. Web. doi:10.1107/S1600577518006318.
Zou, Mengnan, Gaowei, Mengjia, Zhou, Tianyi, Sumant, Anirudha V., Jaye, Cherno, Fisher, Daniel A., Bohon, Jen, Smedley, John, & Muller, Erik M. An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts. United States. doi:10.1107/S1600577518006318.
Zou, Mengnan, Gaowei, Mengjia, Zhou, Tianyi, Sumant, Anirudha V., Jaye, Cherno, Fisher, Daniel A., Bohon, Jen, Smedley, John, and Muller, Erik M. Thu . "An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts". United States. doi:10.1107/S1600577518006318.
@article{osti_1440968,
title = {An all-diamond X-ray position and flux monitor using nitrogen-incorporated ultra-nanocrystalline diamond contacts},
author = {Zou, Mengnan and Gaowei, Mengjia and Zhou, Tianyi and Sumant, Anirudha V. and Jaye, Cherno and Fisher, Daniel A. and Bohon, Jen and Smedley, John and Muller, Erik M.},
abstractNote = {Diamond X-ray detectors with conducting nitrogen-incorporated ultra-nanocrystalline diamond (N-UNCD) films as electrodes were fabricated to measure X-ray beam flux and position. Structural characterization and functionality tests were performed for these devices. The N-UNCD films grown on unseeded diamond substrates were compared with N-UNCD films grown on a seeded silicon substrate. The feasibility of the N-UNCD films acting as electrodes for X-ray detectors was confirmed by the stable performance in a monochromatic X-ray beam. The fabrication process is able to change the surface status which may influence the signal uniformity under low bias, but this effect can be neglected under full collection bias.},
doi = {10.1107/S1600577518006318},
journal = {Journal of Synchrotron Radiation (Online)},
issn = {1600-5775},
number = 4,
volume = 25,
place = {United States},
year = {2018},
month = {5}
}

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