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Title: Hierarchical Domain Structure and Extremely Large Wall Current in Epitaxial BiFeO 3 Thin Films

Authors:
 [1];  [2];  [1];  [1];  [2];  [3];  [4]; ORCiD logo [1]
  1. State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433 China
  2. Department of Materials Science and Engineering, The Pennsylvania State University, University Park PA 16802 USA
  3. Department of Chemistry, St. Andrews University, KY16 9ST St. Andrews UK, Department of Physics, St. Andrews University, KY16 9ST St. Andrews UK
  4. Department of Materials Science and Engineering, Seoul National University, Seoul 151-744 Korea, Inter-University Semiconductor Research Center, Seoul National University, Seoul 151-744 Korea
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1440787
Grant/Contract Number:
FG02-07ER46417
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Advanced Functional Materials
Additional Journal Information:
Related Information: CHORUS Timestamp: 2018-06-06 09:21:31; Journal ID: ISSN 1616-301X
Publisher:
Wiley Blackwell (John Wiley & Sons)
Country of Publication:
Germany
Language:
English

Citation Formats

Bai, Zi Long, Cheng, Xiao Xing, Chen, Dong Fang, Zhang, David Wei, Chen, Long-Qing, Scott, James F., Hwang, Cheol Seong, and Jiang, An Quan. Hierarchical Domain Structure and Extremely Large Wall Current in Epitaxial BiFeO 3 Thin Films. Germany: N. p., 2018. Web. doi:10.1002/adfm.201801725.
Bai, Zi Long, Cheng, Xiao Xing, Chen, Dong Fang, Zhang, David Wei, Chen, Long-Qing, Scott, James F., Hwang, Cheol Seong, & Jiang, An Quan. Hierarchical Domain Structure and Extremely Large Wall Current in Epitaxial BiFeO 3 Thin Films. Germany. doi:10.1002/adfm.201801725.
Bai, Zi Long, Cheng, Xiao Xing, Chen, Dong Fang, Zhang, David Wei, Chen, Long-Qing, Scott, James F., Hwang, Cheol Seong, and Jiang, An Quan. Wed . "Hierarchical Domain Structure and Extremely Large Wall Current in Epitaxial BiFeO 3 Thin Films". Germany. doi:10.1002/adfm.201801725.
@article{osti_1440787,
title = {Hierarchical Domain Structure and Extremely Large Wall Current in Epitaxial BiFeO 3 Thin Films},
author = {Bai, Zi Long and Cheng, Xiao Xing and Chen, Dong Fang and Zhang, David Wei and Chen, Long-Qing and Scott, James F. and Hwang, Cheol Seong and Jiang, An Quan},
abstractNote = {},
doi = {10.1002/adfm.201801725},
journal = {Advanced Functional Materials},
number = ,
volume = ,
place = {Germany},
year = {Wed Jun 06 00:00:00 EDT 2018},
month = {Wed Jun 06 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on June 6, 2019
Publisher's Accepted Manuscript

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