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Title: Development of a broadband reflectivity diagnostic for laser driven shock compression experiments

Abstract

Here, a normal-incidence visible and near-infrared shock wave optical reflectivity diagnostic was constructed to investigate changes in the optical properties of materials under dynamic laser compression. Documenting wavelength- and time-dependent changes in the optical properties of laser-shock compressed samples has been difficult, primarily due to the small sample sizes and short time scales involved, but we succeeded in doing so by broadening a series of time delayed 800-nm pulses from an ultrafast Ti:sapphire laser to generate high-intensity broadband light at nanosecond time scales. This diagnostic was demonstrated over the wavelength range 450–1150 nm with up to 16 time displaced spectra during a single shock experiment. Simultaneous off-normal incidence velocity interferometry (velocity interferometer system for any reflector) characterized the sample under laser-compression and also provided an independent reflectivity measurement at 532 nm wavelength. The shock-driven semiconductor-to-metallic transition in germanium was documented by the way of reflectivity measurements with 0.5 ns time resolution and a wavelength resolution of 10 nm.

Authors:
 [1]; ORCiD logo [2];  [3];  [4]
  1. Univ. of California, Berkeley, CA (United States); Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
  3. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  4. Univ. of California, Berkeley, CA (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1440726
Alternate Identifier(s):
OSTI ID: 1228192
Report Number(s):
LLNL-JRNL-660626
Journal ID: ISSN 0034-6748; RSINAK; 781785
Grant/Contract Number:
AC52-07NA27344; DE - AC52 - 07NA27344
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 4; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Ali, S. J., Bolme, C. A., Collins, G. W., and Jeanloz, R.. Development of a broadband reflectivity diagnostic for laser driven shock compression experiments. United States: N. p., 2015. Web. doi:10.1063/1.4917195.
Ali, S. J., Bolme, C. A., Collins, G. W., & Jeanloz, R.. Development of a broadband reflectivity diagnostic for laser driven shock compression experiments. United States. doi:10.1063/1.4917195.
Ali, S. J., Bolme, C. A., Collins, G. W., and Jeanloz, R.. Thu . "Development of a broadband reflectivity diagnostic for laser driven shock compression experiments". United States. doi:10.1063/1.4917195. https://www.osti.gov/servlets/purl/1440726.
@article{osti_1440726,
title = {Development of a broadband reflectivity diagnostic for laser driven shock compression experiments},
author = {Ali, S. J. and Bolme, C. A. and Collins, G. W. and Jeanloz, R.},
abstractNote = {Here, a normal-incidence visible and near-infrared shock wave optical reflectivity diagnostic was constructed to investigate changes in the optical properties of materials under dynamic laser compression. Documenting wavelength- and time-dependent changes in the optical properties of laser-shock compressed samples has been difficult, primarily due to the small sample sizes and short time scales involved, but we succeeded in doing so by broadening a series of time delayed 800-nm pulses from an ultrafast Ti:sapphire laser to generate high-intensity broadband light at nanosecond time scales. This diagnostic was demonstrated over the wavelength range 450–1150 nm with up to 16 time displaced spectra during a single shock experiment. Simultaneous off-normal incidence velocity interferometry (velocity interferometer system for any reflector) characterized the sample under laser-compression and also provided an independent reflectivity measurement at 532 nm wavelength. The shock-driven semiconductor-to-metallic transition in germanium was documented by the way of reflectivity measurements with 0.5 ns time resolution and a wavelength resolution of 10 nm.},
doi = {10.1063/1.4917195},
journal = {Review of Scientific Instruments},
number = 4,
volume = 86,
place = {United States},
year = {Thu Apr 16 00:00:00 EDT 2015},
month = {Thu Apr 16 00:00:00 EDT 2015}
}

Journal Article:
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