Thermal annealing behavior of hydrogen and surface topography of H2+ ion implanted tungsten
- School of Nuclear Science and Technology, Lanzhou University, Lanzhou, China; Pacific Northwest National Laboratory, Richland, WA, USA
- Pacific Northwest National Laboratory, Richland, WA, USA
- Department of Nuclear Engineering, Texas A&,M University, College Station, TX, USA
- School of Nuclear Science and Technology, Lanzhou University, Lanzhou, China
Tungsten (W) has been proposed as a plasma-facing material (PFM) in fusion reactors due to its outstanding properties. Degradation of the material properties is expected to occur as a result of hydrogen (H) isotope permeation and trapping in W. In this study, two polycrystalline W plates were implanted with 80 keV H2+ ions to a fluence of 2E21 H+/m2 at room temperature (RT). Time-of-flight secondary ion mass spectrometry (ToF-SIMS), focused ion beam (FIB) and scanning electron microscopy (SEM) were used for sample characterization. The SIMS data shows that H atoms are distributed well beyond the ion projected range. Isochronal annealing appears to suggest two H release stages that might be associated with the reported activation energies. H release at RT was observed between days 10 and 70 following ion implantation, and the level was maintained over the next 60 days. In addition, FIB/SEM results exhibit H2 blister formation near the surface of the as-implanted W. The blister distribution remains unchanged after thermal annealing up to 600 °C.
- Research Organization:
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-76RL01830
- OSTI ID:
- 1439693
- Report Number(s):
- PNNL-SA-131482; AT2030110
- Journal Information:
- Journal of Nuclear Science and Technology (Tokyo), Vol. 55, Issue 7; ISSN 0022-3131
- Publisher:
- Taylor & Francis
- Country of Publication:
- United States
- Language:
- English
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