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Title: Rapid pulse annealing of CdZnTe detectors for reducing electronic noise

Abstract

A combination of doping, rapid pulsed optical and/or thermal annealing, and unique detector structure reduces or eliminates sources of electronic noise in a CdZnTe (CZT) detector. According to several embodiments, methods of forming a detector exhibiting minimal electronic noise include: pulse-annealing at least one surface of a detector comprising CZT for one or more pulses, each pulse having a duration of .about.0.1 seconds or less. The at least one surface may optionally be ion-implanted. In another embodiment, a CZT detector includes a detector surface with two or more electrodes operating at different electric potentials and coupled to the detector surface; and one or more ion-implanted CZT surfaces on or in the detector surface, each of the one or more ion-implanted CZT surfaces being independently connected to one of the two or more electrodes and the surface of the detector. At least two of the ion-implanted surfaces are in electrical contact.

Inventors:
; ; ; ; ;
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1438418
Patent Number(s):
9,960,310
Application Number:
15/343,081
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA) LLNL
DOE Contract Number:  
AC52-07NA27344
Resource Type:
Patent
Resource Relation:
Patent File Date: 2016 Nov 03
Country of Publication:
United States
Language:
English

Citation Formats

Voss, Lars, Conway, Adam, Nelson, Art, Nikolic, Rebecca J., Payne, Stephen A., and Swanberg, Jr., Erik Lars. Rapid pulse annealing of CdZnTe detectors for reducing electronic noise. United States: N. p., 2018. Web.
Voss, Lars, Conway, Adam, Nelson, Art, Nikolic, Rebecca J., Payne, Stephen A., & Swanberg, Jr., Erik Lars. Rapid pulse annealing of CdZnTe detectors for reducing electronic noise. United States.
Voss, Lars, Conway, Adam, Nelson, Art, Nikolic, Rebecca J., Payne, Stephen A., and Swanberg, Jr., Erik Lars. Tue . "Rapid pulse annealing of CdZnTe detectors for reducing electronic noise". United States. doi:. https://www.osti.gov/servlets/purl/1438418.
@article{osti_1438418,
title = {Rapid pulse annealing of CdZnTe detectors for reducing electronic noise},
author = {Voss, Lars and Conway, Adam and Nelson, Art and Nikolic, Rebecca J. and Payne, Stephen A. and Swanberg, Jr., Erik Lars},
abstractNote = {A combination of doping, rapid pulsed optical and/or thermal annealing, and unique detector structure reduces or eliminates sources of electronic noise in a CdZnTe (CZT) detector. According to several embodiments, methods of forming a detector exhibiting minimal electronic noise include: pulse-annealing at least one surface of a detector comprising CZT for one or more pulses, each pulse having a duration of .about.0.1 seconds or less. The at least one surface may optionally be ion-implanted. In another embodiment, a CZT detector includes a detector surface with two or more electrodes operating at different electric potentials and coupled to the detector surface; and one or more ion-implanted CZT surfaces on or in the detector surface, each of the one or more ion-implanted CZT surfaces being independently connected to one of the two or more electrodes and the surface of the detector. At least two of the ion-implanted surfaces are in electrical contact.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue May 01 00:00:00 EDT 2018},
month = {Tue May 01 00:00:00 EDT 2018}
}

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