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Title: Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics

Abstract

Experiments using high brightness X-rays are on the forefront of science due to the vast variety of knowledge they can provide. New Synchrotron Radiation (SR) and Free Electron Laser (FEL) light sources provide unique tools for advanced studies using X-rays. Top-level scientists from around the world are attracted to these beamlines to perform unprecedented experiments. High brightness, low emittance light sources allow beamline scientists the possibility to dream up cutting-edge experimental stations. X-ray optics play a key role in bringing the beam from the source to the experimental stations. This paper explores the recent developments in X-ray optics. It touches on simulations, diagnostics, metrology and adaptive optics, giving an overview of the role X-ray optics have played in the recent past. It will also touch on future developments for one of the most active field in the X-ray science.

Authors:
 [1];  [2];  [1];  [3];  [4]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. Elettra-Sincrotrone Trieste SCpa, Trieste (Italy)
  4. Elettra-Sincrotrone Trieste SCpa, Trieste (Italy); IOM-CNR, Trieste (Italy)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1438324
Report Number(s):
BNL-205685-2018-JAAM
Journal ID: ISSN 0168-9002
Grant/Contract Number:
SC0012704
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Additional Journal Information:
Journal Name: Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment; Journal ID: ISSN 0168-9002
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; X-ray optics; Optical metrology; Active optics; Synchrotron optics; FEL optics; Wavefront propagation

Citation Formats

Cocco, Daniele, Idir, Mourad, Morton, Daniel, Raimondi, Lorenzo, and Zangrando, Marco. Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics. United States: N. p., 2018. Web. doi:10.1016/j.nima.2018.03.026.
Cocco, Daniele, Idir, Mourad, Morton, Daniel, Raimondi, Lorenzo, & Zangrando, Marco. Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics. United States. doi:10.1016/j.nima.2018.03.026.
Cocco, Daniele, Idir, Mourad, Morton, Daniel, Raimondi, Lorenzo, and Zangrando, Marco. Tue . "Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics". United States. doi:10.1016/j.nima.2018.03.026.
@article{osti_1438324,
title = {Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics},
author = {Cocco, Daniele and Idir, Mourad and Morton, Daniel and Raimondi, Lorenzo and Zangrando, Marco},
abstractNote = {Experiments using high brightness X-rays are on the forefront of science due to the vast variety of knowledge they can provide. New Synchrotron Radiation (SR) and Free Electron Laser (FEL) light sources provide unique tools for advanced studies using X-rays. Top-level scientists from around the world are attracted to these beamlines to perform unprecedented experiments. High brightness, low emittance light sources allow beamline scientists the possibility to dream up cutting-edge experimental stations. X-ray optics play a key role in bringing the beam from the source to the experimental stations. This paper explores the recent developments in X-ray optics. It touches on simulations, diagnostics, metrology and adaptive optics, giving an overview of the role X-ray optics have played in the recent past. It will also touch on future developments for one of the most active field in the X-ray science.},
doi = {10.1016/j.nima.2018.03.026},
journal = {Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment},
number = ,
volume = ,
place = {United States},
year = {Tue Mar 20 00:00:00 EDT 2018},
month = {Tue Mar 20 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on March 20, 2019
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