Conduction mechanisms, dynamics and stability in ReRAMs
Journal Article
·
· Microelectronic Engineering
- Sponsoring Organization:
- USDOE Office of Electricity (OE), Advanced Grid Research & Development. Power Systems Engineering Research
- Grant/Contract Number:
- 2017YFA0207600
- OSTI ID:
- 1437759
- Journal Information:
- Microelectronic Engineering, Journal Name: Microelectronic Engineering Vol. 187-188 Journal Issue: C; ISSN 0167-9317
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- Netherlands
- Language:
- English
Cited by: 66 works
Citation information provided by
Web of Science
Web of Science
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