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Title: Development of a fast framing detector for electron microscopy

Abstract

A high frame rate detector system is described that enables fast real-time data analysis of scanning diffraction experiments in scanning transmission electron microscopy (STEM). This is an end-to-end development that encompasses the data producing detector, data transportation, and real-time processing of data. The detector will consist of a central pixel sensor that is surrounded by annular silicon diodes. Both components of the detector system will synchronously capture data at almost 100 kHz frame rate, which produces an approximately 400 Gb/s data stream. Low-level preprocessing will be implemented in firmware before the data is streamed from the National Center for Electron Microscopy (NCEM) to the National Energy Research Scientific Computing Center (NERSC). Live data processing, before it lands on disk, will happen on the Cori supercomputer and aims to present scientists with prompt experimental feedback. This online analysis will provide rough information of the sample that can be utilized for sample alignment, sample monitoring and verification that the experiment is set up correctly. Only a compressed version of the relevant data is then selected for more in-depth processing.

Authors:
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Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
SC-22.3 USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division
OSTI Identifier:
1436646
DOE Contract Number:  
AC02-05CH11231
Resource Type:
Conference
Resource Relation:
Conference: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016, Strasbourg (France), 29 Oct - 6 Nov 2016
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Johnson, Ian J., Bustillo, Karen C., Ciston, Jim, Dart, Eli, Draney, Brent R., Ercius, Peter, Fong, Erin, Grace, Carl R., Joseph, John M., Lee, Jason R., Minor, Andrew M., Ophus, Colin, Skinner, David E., Stezelberger, Thorsten, Tindall, Craig S., and Denes, Peter. Development of a fast framing detector for electron microscopy. United States: N. p., 2016. Web. doi:10.1109/NSSMIC.2016.8069681.
Johnson, Ian J., Bustillo, Karen C., Ciston, Jim, Dart, Eli, Draney, Brent R., Ercius, Peter, Fong, Erin, Grace, Carl R., Joseph, John M., Lee, Jason R., Minor, Andrew M., Ophus, Colin, Skinner, David E., Stezelberger, Thorsten, Tindall, Craig S., & Denes, Peter. Development of a fast framing detector for electron microscopy. United States. doi:10.1109/NSSMIC.2016.8069681.
Johnson, Ian J., Bustillo, Karen C., Ciston, Jim, Dart, Eli, Draney, Brent R., Ercius, Peter, Fong, Erin, Grace, Carl R., Joseph, John M., Lee, Jason R., Minor, Andrew M., Ophus, Colin, Skinner, David E., Stezelberger, Thorsten, Tindall, Craig S., and Denes, Peter. Sat . "Development of a fast framing detector for electron microscopy". United States. doi:10.1109/NSSMIC.2016.8069681. https://www.osti.gov/servlets/purl/1436646.
@article{osti_1436646,
title = {Development of a fast framing detector for electron microscopy},
author = {Johnson, Ian J. and Bustillo, Karen C. and Ciston, Jim and Dart, Eli and Draney, Brent R. and Ercius, Peter and Fong, Erin and Grace, Carl R. and Joseph, John M. and Lee, Jason R. and Minor, Andrew M. and Ophus, Colin and Skinner, David E. and Stezelberger, Thorsten and Tindall, Craig S. and Denes, Peter},
abstractNote = {A high frame rate detector system is described that enables fast real-time data analysis of scanning diffraction experiments in scanning transmission electron microscopy (STEM). This is an end-to-end development that encompasses the data producing detector, data transportation, and real-time processing of data. The detector will consist of a central pixel sensor that is surrounded by annular silicon diodes. Both components of the detector system will synchronously capture data at almost 100 kHz frame rate, which produces an approximately 400 Gb/s data stream. Low-level preprocessing will be implemented in firmware before the data is streamed from the National Center for Electron Microscopy (NCEM) to the National Energy Research Scientific Computing Center (NERSC). Live data processing, before it lands on disk, will happen on the Cori supercomputer and aims to present scientists with prompt experimental feedback. This online analysis will provide rough information of the sample that can be utilized for sample alignment, sample monitoring and verification that the experiment is set up correctly. Only a compressed version of the relevant data is then selected for more in-depth processing.},
doi = {10.1109/NSSMIC.2016.8069681},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Oct 01 00:00:00 EDT 2016},
month = {Sat Oct 01 00:00:00 EDT 2016}
}

Conference:
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