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Title: Multi-slice ptychography with large numerical aperture multilayer Laue lenses

Abstract

Here, the highly convergent x-ray beam focused by multilayer Laue lenses with large numerical apertures is used as a three-dimensional (3D) probe to image layered structures with an axial separation larger than the depth of focus. Instead of collecting weakly scattered high-spatial-frequency signals, the depth-resolving power is provided purely by the intense central cone diverged from the focused beam. Using the multi-slice ptychography method combined with the on-the-fly scan scheme, two layers of nanoparticles separated by 10 μm are successfully reconstructed with 8.1 nm lateral resolution and with a dwell time as low as 0.05 s per scan point. This approach obtains high-resolution images with extended depth of field, which paves the way for multi-slice ptychography as a high throughput technique for high-resolution 3D imaging of thick samples.

Authors:
 [1];  [1];  [2];  [1];  [1];  [1];  [1];  [3];  [1];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States); Shanghai Institute of Applied Physics, Shanghai (China)
  3. Brookhaven National Lab. (BNL), Upton, NY (United States); Research Complex at Harwell, Oxfordshire (United Kingdom); Univ. College London, London (United Kingdom)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1436220
Alternate Identifier(s):
OSTI ID: 1437944
Report Number(s):
BNL-204651-2018-JAAM
Journal ID: ISSN 2334-2536
Grant/Contract Number:  
SC0012704; LDRD-21690
Resource Type:
Journal Article: Published Article
Journal Name:
Optica
Additional Journal Information:
Journal Volume: 5; Journal Issue: 5; Journal ID: ISSN 2334-2536
Publisher:
Optical Society of America
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; X-ray imaging; Phase retrieval; X-ray optics

Citation Formats

Ozturk, Hande, Yan, Hanfei, He, Yan, Ge, Mingyuan, Dong, Zhihua, Lin, Meifeng, Nazaretski, Evgeny, Robinson, Ian K., Chu, Yong S., and Huang, Xiaojing. Multi-slice ptychography with large numerical aperture multilayer Laue lenses. United States: N. p., 2018. Web. doi:10.1364/OPTICA.5.000601.
Ozturk, Hande, Yan, Hanfei, He, Yan, Ge, Mingyuan, Dong, Zhihua, Lin, Meifeng, Nazaretski, Evgeny, Robinson, Ian K., Chu, Yong S., & Huang, Xiaojing. Multi-slice ptychography with large numerical aperture multilayer Laue lenses. United States. doi:10.1364/OPTICA.5.000601.
Ozturk, Hande, Yan, Hanfei, He, Yan, Ge, Mingyuan, Dong, Zhihua, Lin, Meifeng, Nazaretski, Evgeny, Robinson, Ian K., Chu, Yong S., and Huang, Xiaojing. Wed . "Multi-slice ptychography with large numerical aperture multilayer Laue lenses". United States. doi:10.1364/OPTICA.5.000601.
@article{osti_1436220,
title = {Multi-slice ptychography with large numerical aperture multilayer Laue lenses},
author = {Ozturk, Hande and Yan, Hanfei and He, Yan and Ge, Mingyuan and Dong, Zhihua and Lin, Meifeng and Nazaretski, Evgeny and Robinson, Ian K. and Chu, Yong S. and Huang, Xiaojing},
abstractNote = {Here, the highly convergent x-ray beam focused by multilayer Laue lenses with large numerical apertures is used as a three-dimensional (3D) probe to image layered structures with an axial separation larger than the depth of focus. Instead of collecting weakly scattered high-spatial-frequency signals, the depth-resolving power is provided purely by the intense central cone diverged from the focused beam. Using the multi-slice ptychography method combined with the on-the-fly scan scheme, two layers of nanoparticles separated by 10 μm are successfully reconstructed with 8.1 nm lateral resolution and with a dwell time as low as 0.05 s per scan point. This approach obtains high-resolution images with extended depth of field, which paves the way for multi-slice ptychography as a high throughput technique for high-resolution 3D imaging of thick samples.},
doi = {10.1364/OPTICA.5.000601},
journal = {Optica},
issn = {2334-2536},
number = 5,
volume = 5,
place = {United States},
year = {2018},
month = {5}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1364/OPTICA.5.000601

Citation Metrics:
Cited by: 1 work
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