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Title: Demonstration of transmission high energy electron microscopy

Abstract

High energy electrons have been used to investigate an extension of transmission electron microscopy. This technique, transmission high energy electron microscopy (THEEM), provides two additional capabilities to electron microscopy. First, high energy electrons are more penetrating than low energy electrons, and thus, they are able to image through thicker samples. Second, the accelerating mode of a radio-frequency linear accelerator provides fast exposures, down to 1 ps, which are ideal for flash radiography, making THEEM well suited to study the evolution of fast material processes under dynamic conditions. Lastly, initial investigations with static objects and during material processing have been performed to investigate the capabilities of this technique.

Authors:
ORCiD logo [1];  [1];  [1];  [1];  [1]; ORCiD logo [1];  [1];  [1];  [1];  [1];  [1]; ORCiD logo [1];  [1];  [2];  [2];  [2];  [3];  [4]; ORCiD logo [5]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)
  4. Colorado School of Mines, Golden, CO (United States)
  5. IMDEA Materials Inst., Madrid (Spain)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1436077
Alternate Identifier(s):
OSTI ID: 1432091
Grant/Contract Number:
AC02-76SF00515; AC52-06NA25396; SC0016061
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 112; Journal Issue: 14; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Merrill, F. E., Goett, J., Gibbs, J. W., Imhoff, S. D., Mariam, F. G., Morris, C. L., Neukirch, L. P., Perry, J., Poulson, D., Simpson, R., Volegov, P. L., Walstrom, P. L., Wilde, C. H., Hast, C., Jobe, K., Smith, T., Wienands, U., Clarke, A. J., and Tourret, D. Demonstration of transmission high energy electron microscopy. United States: N. p., 2018. Web. doi:10.1063/1.5011198.
Merrill, F. E., Goett, J., Gibbs, J. W., Imhoff, S. D., Mariam, F. G., Morris, C. L., Neukirch, L. P., Perry, J., Poulson, D., Simpson, R., Volegov, P. L., Walstrom, P. L., Wilde, C. H., Hast, C., Jobe, K., Smith, T., Wienands, U., Clarke, A. J., & Tourret, D. Demonstration of transmission high energy electron microscopy. United States. doi:10.1063/1.5011198.
Merrill, F. E., Goett, J., Gibbs, J. W., Imhoff, S. D., Mariam, F. G., Morris, C. L., Neukirch, L. P., Perry, J., Poulson, D., Simpson, R., Volegov, P. L., Walstrom, P. L., Wilde, C. H., Hast, C., Jobe, K., Smith, T., Wienands, U., Clarke, A. J., and Tourret, D. Fri . "Demonstration of transmission high energy electron microscopy". United States. doi:10.1063/1.5011198.
@article{osti_1436077,
title = {Demonstration of transmission high energy electron microscopy},
author = {Merrill, F. E. and Goett, J. and Gibbs, J. W. and Imhoff, S. D. and Mariam, F. G. and Morris, C. L. and Neukirch, L. P. and Perry, J. and Poulson, D. and Simpson, R. and Volegov, P. L. and Walstrom, P. L. and Wilde, C. H. and Hast, C. and Jobe, K. and Smith, T. and Wienands, U. and Clarke, A. J. and Tourret, D.},
abstractNote = {High energy electrons have been used to investigate an extension of transmission electron microscopy. This technique, transmission high energy electron microscopy (THEEM), provides two additional capabilities to electron microscopy. First, high energy electrons are more penetrating than low energy electrons, and thus, they are able to image through thicker samples. Second, the accelerating mode of a radio-frequency linear accelerator provides fast exposures, down to 1 ps, which are ideal for flash radiography, making THEEM well suited to study the evolution of fast material processes under dynamic conditions. Lastly, initial investigations with static objects and during material processing have been performed to investigate the capabilities of this technique.},
doi = {10.1063/1.5011198},
journal = {Applied Physics Letters},
number = 14,
volume = 112,
place = {United States},
year = {Fri Apr 06 00:00:00 EDT 2018},
month = {Fri Apr 06 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on April 6, 2019
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