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Title: THE DETERMINATION OF RADIATION HARDNESS OF SEMICONDUCTOR MATERIALS AND DEVICES WITH ION BEAMS.

Abstract

Abstract not provided.

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1436059
Report Number(s):
SAND2018-4338R
662672
DOE Contract Number:
AC04-94AL85000
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English

Citation Formats

Vizkelethy, Gyorgy, Vittone, Ettore, Pastuovic, Zjelko, Siegele, Rainer, Jaksic, Milko, Grilj, Veljko, Skukan, Natko, Garcia Lopez, Javier, and Jimenez Ramos, Carmen. THE DETERMINATION OF RADIATION HARDNESS OF SEMICONDUCTOR MATERIALS AND DEVICES WITH ION BEAMS.. United States: N. p., 2018. Web. doi:10.2172/1436059.
Vizkelethy, Gyorgy, Vittone, Ettore, Pastuovic, Zjelko, Siegele, Rainer, Jaksic, Milko, Grilj, Veljko, Skukan, Natko, Garcia Lopez, Javier, & Jimenez Ramos, Carmen. THE DETERMINATION OF RADIATION HARDNESS OF SEMICONDUCTOR MATERIALS AND DEVICES WITH ION BEAMS.. United States. doi:10.2172/1436059.
Vizkelethy, Gyorgy, Vittone, Ettore, Pastuovic, Zjelko, Siegele, Rainer, Jaksic, Milko, Grilj, Veljko, Skukan, Natko, Garcia Lopez, Javier, and Jimenez Ramos, Carmen. Sun . "THE DETERMINATION OF RADIATION HARDNESS OF SEMICONDUCTOR MATERIALS AND DEVICES WITH ION BEAMS.". United States. doi:10.2172/1436059. https://www.osti.gov/servlets/purl/1436059.
@article{osti_1436059,
title = {THE DETERMINATION OF RADIATION HARDNESS OF SEMICONDUCTOR MATERIALS AND DEVICES WITH ION BEAMS.},
author = {Vizkelethy, Gyorgy and Vittone, Ettore and Pastuovic, Zjelko and Siegele, Rainer and Jaksic, Milko and Grilj, Veljko and Skukan, Natko and Garcia Lopez, Javier and Jimenez Ramos, Carmen},
abstractNote = {Abstract not provided.},
doi = {10.2172/1436059},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Apr 01 00:00:00 EDT 2018},
month = {Sun Apr 01 00:00:00 EDT 2018}
}

Technical Report:

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