Crystals for krypton helium-alpha line emission microscopy
A system for reflecting and recording x-ray radiation from an x-ray emitting event to characterize the event. A crystal is aligned to receive radiation along a first path from an x-ray emitting event. Upon striking the crystal, the x-ray reflects from the crystal along a second path due to a reflection plane of the crystal defined by one of the following Miller indices: (9,7,3) or (11,3,3). Exemplary crystalline material is germanium. The x-rays are reflected to a detector aligned to receive reflected x-rays that are reflected from the crystal along the second path and the detector generates a detector signal in response to x-rays impacting the detector. The detector may include a CCD electronic detector, film plates, or any other detector type. A processor receives and processes the detector signal to generate reflection data representing the x-rays emitted from the x-ray emitting event.
- Research Organization:
- Nevada Test Site/National Security Technologies, LLC (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC52-06NA25946
- Assignee:
- National Security Technologies, Inc. (North Las Vegas, NV)
- Patent Number(s):
- 9,945,795
- Application Number:
- 15/073,946
- OSTI ID:
- 1435640
- Country of Publication:
- United States
- Language:
- English
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