skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Synchrotron radiation microbeam X-ray diffraction for nondestructive assessments of local structural properties of faceted InGaN/GaN quantum wells

Authors:
ORCiD logo; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
FOREIGN
OSTI Identifier:
1432883
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Express; Journal Volume: 11; Journal Issue: 3
Country of Publication:
United States
Language:
ENGLISH

Citation Formats

Sakaki, Atsushi, Funato, Mitsuru, Kawamura, Tomoaki, Araki, Jun, and Kawakami, Yoichi. Synchrotron radiation microbeam X-ray diffraction for nondestructive assessments of local structural properties of faceted InGaN/GaN quantum wells. United States: N. p., 2018. Web. doi:10.7567/APEX.11.031001.
Sakaki, Atsushi, Funato, Mitsuru, Kawamura, Tomoaki, Araki, Jun, & Kawakami, Yoichi. Synchrotron radiation microbeam X-ray diffraction for nondestructive assessments of local structural properties of faceted InGaN/GaN quantum wells. United States. doi:10.7567/APEX.11.031001.
Sakaki, Atsushi, Funato, Mitsuru, Kawamura, Tomoaki, Araki, Jun, and Kawakami, Yoichi. Mon . "Synchrotron radiation microbeam X-ray diffraction for nondestructive assessments of local structural properties of faceted InGaN/GaN quantum wells". United States. doi:10.7567/APEX.11.031001.
@article{osti_1432883,
title = {Synchrotron radiation microbeam X-ray diffraction for nondestructive assessments of local structural properties of faceted InGaN/GaN quantum wells},
author = {Sakaki, Atsushi and Funato, Mitsuru and Kawamura, Tomoaki and Araki, Jun and Kawakami, Yoichi},
abstractNote = {},
doi = {10.7567/APEX.11.031001},
journal = {Applied Physics Express},
number = 3,
volume = 11,
place = {United States},
year = {Mon Jan 29 00:00:00 EST 2018},
month = {Mon Jan 29 00:00:00 EST 2018}
}