skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy

Abstract

Here, we report quantitative measurements of nanoscale permittivity and conductivity using tuning-fork (TF) based microwave impedance microscopy (MIM). The system is operated under the driving amplitude modulation mode, which ensures satisfactory feedback stability on samples with rough surfaces. The demodulated MIM signals on a series of bulk dielectrics are in good agreement with results simulated by finite-element analysis. Using the TF-MIM, we have visualized the evolution of nanoscale conductance on back-gated MoS 2 field effect transistors, and the results are consistent with the transport data. Our work suggests that quantitative analysis of mesoscopic electrical properties can be achieved by near-field microwave imaging with small distance modulation.

Authors:
ORCiD logo [1];  [2]; ORCiD logo [1];  [1]; ORCiD logo [1];  [1];  [3]; ORCiD logo [1]
  1. Univ. of Texas, Austin, TX (United States). Dept. of Physics
  2. Tsinghua Univ., Bejing (China). State Key Lab. of Low Dimensional Quantum Physics and Dept. of Physics
  3. Tsinghua Univ., Bejing (China). State Key Lab. of Low Dimensional Quantum Physics and Dept. of Physics; Collaborative Innovation Center of Quantum Matter (CICQM), Beijing (China)
Publication Date:
Research Org.:
Univ. of Texas, Austin, TX (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1431207
Alternate Identifier(s):
OSTI ID: 1431389
Grant/Contract Number:  
SC0010308
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 4; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; permittivity; conductivity; tuning fork; microwave impedance microscopy; materials; dielectrics; metals; condensed matter properties; radiowave and microwave technology; electrical properties; metalloids; metallurgy; chemical analysis

Citation Formats

Wu, Xiaoyu, Hao, Zhenqi, Wu, Di, Zheng, Lu, Jiang, Zhanzhi, Ganesan, Vishal, Wang, Yayu, and Lai, Keji. Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy. United States: N. p., 2018. Web. doi:10.1063/1.5022997.
Wu, Xiaoyu, Hao, Zhenqi, Wu, Di, Zheng, Lu, Jiang, Zhanzhi, Ganesan, Vishal, Wang, Yayu, & Lai, Keji. Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy. United States. doi:10.1063/1.5022997.
Wu, Xiaoyu, Hao, Zhenqi, Wu, Di, Zheng, Lu, Jiang, Zhanzhi, Ganesan, Vishal, Wang, Yayu, and Lai, Keji. Sun . "Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy". United States. doi:10.1063/1.5022997.
@article{osti_1431207,
title = {Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy},
author = {Wu, Xiaoyu and Hao, Zhenqi and Wu, Di and Zheng, Lu and Jiang, Zhanzhi and Ganesan, Vishal and Wang, Yayu and Lai, Keji},
abstractNote = {Here, we report quantitative measurements of nanoscale permittivity and conductivity using tuning-fork (TF) based microwave impedance microscopy (MIM). The system is operated under the driving amplitude modulation mode, which ensures satisfactory feedback stability on samples with rough surfaces. The demodulated MIM signals on a series of bulk dielectrics are in good agreement with results simulated by finite-element analysis. Using the TF-MIM, we have visualized the evolution of nanoscale conductance on back-gated MoS2 field effect transistors, and the results are consistent with the transport data. Our work suggests that quantitative analysis of mesoscopic electrical properties can be achieved by near-field microwave imaging with small distance modulation.},
doi = {10.1063/1.5022997},
journal = {Review of Scientific Instruments},
number = 4,
volume = 89,
place = {United States},
year = {Sun Apr 01 00:00:00 EDT 2018},
month = {Sun Apr 01 00:00:00 EDT 2018}
}

Journal Article:
Free Publicly Available Full Text
This content will become publicly available on April 1, 2019
Publisher's Version of Record

Save / Share: